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Consortium of Swiss Academic Libraries

Integrating 3D Surface Imaging with FIB/SEM Microscopy

Volbert, B. ; Renka, G. ; Schock, K. ; Lieb, A. ; Dadras, M. ; Kleindiek, S.

In: Microscopy and Microanalysis, 2014, vol. 20, no. S3, p. 2066-2067

Consortium of Swiss Academic Libraries

3D EDX microanalysis by FIB-SEM: Elemental quantification enhancement

Burdet, P. ; Cantoni, M. ; Hébert, C.

In: Microscopy and Microanalysis, 2012, vol. 18, no. S2, p. 526-527