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Diffuse reflection of ultracold neutrons from low-roughness surfaces

Atchison, F. ; Daum, M. ; Henneck, R. ; Heule, S. ; Horisberger, M. ; Kasprzak, M. ; Kirch, K. ; Knecht, A. ; Kużniak, M. ; Lauss, B. ; Mtchedlishvili, A. ; Meier, M. ; Petzoldt, G. ; Plonka-Spehr, C. ; Schelldorfer, R. ; Straumann, U. ; Zsigmond, G.

In: The European Physical Journal A, 2010, vol. 44, no. 1, p. 23-29

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    Titre
    • Diffuse reflection of ultracold neutrons from low-roughness surfaces
    Auteur
    • Atchison, F.. Paul Scherrer Institut, PSI, Villigen, Switzerland
    • Daum, M.. Paul Scherrer Institut, PSI, Villigen, Switzerland
    • Henneck, R.. Paul Scherrer Institut, PSI, Villigen, Switzerland
    • Heule, S.. Paul Scherrer Institut, PSI, Villigen, Switzerland
    • Horisberger, M.. Paul Scherrer Institut, PSI, Villigen, Switzerland
    • Kasprzak, M.. Paul Scherrer Institut, PSI, Villigen, Switzerland
    • Kirch, K.. Paul Scherrer Institut, PSI, Villigen, Switzerland
    • Knecht, A.. Paul Scherrer Institut, PSI, Villigen, Switzerland
    • Kużniak, M.. Paul Scherrer Institut, PSI, Villigen, Switzerland
    • Lauss, B.. Paul Scherrer Institut, PSI, Villigen, Switzerland
    • Mtchedlishvili, A.. Paul Scherrer Institut, PSI, Villigen, Switzerland
    • Meier, M.. Paul Scherrer Institut, PSI, Villigen, Switzerland
    • Petzoldt, G.. Paul Scherrer Institut, PSI, Villigen, Switzerland
    • Plonka-Spehr, C.. Institut Laue Langevin, ILL, Grenoble, France
    • Schelldorfer, R.. Paul Scherrer Institut, PSI, Villigen, Switzerland
    • Straumann, U.. University Zürich, Zürich, Switzerland
    • Zsigmond, G.. Paul Scherrer Institut, PSI, Villigen, Switzerland
    Type de document
    • Postprint
    Classification
    • Technologie, Sciences de l'ingénieur
    Identifiant OAI-PMH
    • oai:doc.rero.ch:314994
    Summary
    We report a measurement of the reflection of ultracold neutrons from flat, large-area plates of different Fermi potential materials with low surface roughness. The results were used to test two diffuse reflection models, the well-known Lambert model and the micro-roughness model which is based on wave scattering. The Lambert model fails to reproduce the diffuse reflection data. The surface roughness b and correlation length w , obtained by fitting the micro-roughness model to the data are in the range 1$ \le$ b $ \le$3 nm and 10$ \le$ w $ \le$120 nm, in qualitative agreement with independent measurements using atomic force microscopy