Epitaxial Lead Chalcogenides on Si for Mid-IR Detectors and Emitters Including Cavities

Zogg, H. ; Arnold, M. ; Felder, F. ; Rahim, M. ; Ebneter, C. ; Zasavitskiy, I. ; Quack, N. ; Blunier, S. ; Dual, J.

In: Journal of Electronic Materials, 2008, vol. 37, no. 9, p. 1497-1503

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    Summary
    Lead chalcogenide (IV-VI narrow-gap semiconductor) layers on Si or BaF2(111) substrates are employed to realize two mid-infrared optoelectronic devices for the first time. A tunable resonant cavity enhanced detector is realized by employing a movable mirror. Tuning is across the 4μm to 5.5μm wavelength range, and linewidth is <0.1μm. Due to the thin (0.3μm) PbTe photodiode inside the cavity, a higher sensitivity at higher operating temperatures was achieved as compared to conventional thick photodiodes. The second device is an optically pumped vertical external-cavity surface-emitting laser with PbTe-based gain layers. It emits at ∼5μm wavelength and with output power up to 50mW pulsed, or 3mW continuous wave at 100K