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Imaging ‘Invisible' Dopant Atoms in Semiconductor Nanocrystals

Gunawan, A.A. ; Wills, A. ; Mkhoyan, A. ; Thomas, M.G. ; Norris, D.J.

In: Microscopy and Microanalysis, 2012, vol. 18, no. S2, p. 298-299

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    Titre
    • Imaging ‘Invisible' Dopant Atoms in Semiconductor Nanocrystals
    Auteur
    • Gunawan, A.A.. Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN
    • Wills, A.. Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN
    • Mkhoyan, A.. Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN
    • Thomas, M.G.. Cornell University, Ithaca, NY
    • Norris, D.J.. ETH-Zurich, Zurich, Switzerland
    Type de document
    • Postprint
    Langue
    • Anglais
    Publié dans
    • Microscopy and Microanalysis, 2012, vol. 18, no. S2, p. 298-299. Cambridge University Press
    Autre version électronique
    Identifiant OAI-PMH
    • oai:doc.rero.ch:304875
    Summary
    Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 - August 2, 2012