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Quantitative Nano-Analysis of Superconducting Materials via SEM-FIB 3D-EDS Tomography

Pavia, Giuseppe ; Kienle, Martin ; Schulmeyer, Ingo ; Bauer, Frank ; Cantoni, Marco ; Lagarec, Ken

In: Microscopy and Microanalysis, 2015, vol. 21, no. S3, p. 1341-1342

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    Titre
    • Quantitative Nano-Analysis of Superconducting Materials via SEM-FIB 3D-EDS Tomography
    Auteur
    • Pavia, Giuseppe. Carl Zeiss Microscopy GmbH, Product Management Materials, Oberkochen, Germany
    • Kienle, Martin. Carl Zeiss Microscopy GmbH, Product Management Materials, Oberkochen, Germany
    • Schulmeyer, Ingo. Carl Zeiss Microscopy GmbH, Product Management Materials, Oberkochen, Germany
    • Bauer, Frank. Oxford Instruments GmbH, Wiesbaden, Germany
    • Cantoni, Marco. EPFL, CIME, Lausanne, Switzerland
    • Lagarec, Ken. FIBICS Incorporated, Ottawa, Canada
    Type de document
    • Postprint
    Langue
    • Anglais
    Publié dans
    • Microscopy and Microanalysis, 2015, vol. 21, no. S3, p. 1341-1342. Cambridge University Press
    Autre version électronique
    Identifiant OAI-PMH
    • oai:doc.rero.ch:297228