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Integrating Atomic Force Microscopy in Scanning Electron Microscopy
Smith, Andrew J.
;
Schock, Klaus
;
Renka, Gregor
;
Lieb, Andreas
;
Dadras, Massoud
;
Kleindiek, Stephan
In: Microscopy and Microanalysis, 2015, vol. 21, no. S3, p. 1435-1436
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Titre
Integrating Atomic Force Microscopy in Scanning Electron Microscopy
Auteur
Smith, Andrew J.
. Kleindiek Nanotechnik, Reutlingen, Germany
Schock, Klaus
. Kleindiek Nanotechnik, Reutlingen, Germany
Renka, Gregor
. Kleindiek Nanotechnik, Reutlingen, Germany
Lieb, Andreas
. Nanosurf AG, Gräubernstrasse 12-14, 4410 Liestal, Switzerland
Dadras, Massoud
. Centre Suisse d'Électronique et de Microtechnique, CSEM SA, Neuchâtel, Switzerland
Kleindiek, Stephan
. Kleindiek Nanotechnik, Reutlingen, Germany
Type de document
Postprint
Langue
Inglese
Publié dans
Microscopy and Microanalysis,
2015, vol. 21, no. S3, p. 1435-1436. Cambridge University Press
Autre version électronique
Publisher's version :
https://doi.org/10.1017/S1431927615007953
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Santé
Mots clés
Analytical and Instrumentation Science Symposia
Identifiant OAI-PMH
oai:doc.rero.ch:292201