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Integrating Atomic Force Microscopy in Scanning Electron Microscopy

Smith, Andrew J. ; Schock, Klaus ; Renka, Gregor ; Lieb, Andreas ; Dadras, Massoud ; Kleindiek, Stephan

In: Microscopy and Microanalysis, 2015, vol. 21, no. S3, p. 1435-1436

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    Title
    • Integrating Atomic Force Microscopy in Scanning Electron Microscopy
    Author
    • Smith, Andrew J.. Kleindiek Nanotechnik, Reutlingen, Germany
    • Schock, Klaus. Kleindiek Nanotechnik, Reutlingen, Germany
    • Renka, Gregor. Kleindiek Nanotechnik, Reutlingen, Germany
    • Lieb, Andreas. Nanosurf AG, Gräubernstrasse 12-14, 4410 Liestal, Switzerland
    • Dadras, Massoud. Centre Suisse d'Électronique et de Microtechnique, CSEM SA, Neuchâtel, Switzerland
    • Kleindiek, Stephan. Kleindiek Nanotechnik, Reutlingen, Germany
    Document Type
    • Postprint
    Language
    • English
    Published in
    • Microscopy and Microanalysis, 2015, vol. 21, no. S3, p. 1435-1436. Cambridge University Press
    Other Version
    OAI-PMH Identifier
    • oai:doc.rero.ch:292201