In: The Journal of Foraminiferal Research, 2007, vol. 37, no. 3, p. 270-276
We present a recently developed method using a field emission scanning electron microscope (FEG) to view and photograph microfossil specimens that are not coated by conductive material. The FEG microscope provides high electron flux and offers the option to capture images at low beam voltage. Balancing incident energy with absorbed energy from the detector leads to charge-free images of...
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