Refine my results

Document type

Institution

Specific Collection

Language

Université de Fribourg

High-resolution study of the x-ray resonant Raman scattering process around the 1s absorption edge for aluminium, silicon, and their oxides

Szlachetko, Jakub ; Dousse, Jean-Claude ; Berset, Michel ; Fennane, Karima ; Szlachetko, Monika ; Hoszowska, Joanna ; Barrett, R. ; Pajek, M. ; Kubala-Kukus, A.

In: Physical Review A, 2007, vol. 75, no. 2, p. 022512

X-ray resonant Raman scattering (RRS) spectra of Al, Al₂O₃, Si, and SiO₂ were measured at the European Synchrotron Radiation Facility, using a high-resolution Bragg-type curved crystal spectrometer. The x-ray RRS spectra were collected at several beam energies tuned below the 1s absorption thresholds of Al and Si. Differences in the spectral features between the elemental samples and...

Université de Fribourg

High-resolution study of x-ray resonant Raman scattering at the k edge of silicon

Szlachetko, Jakub ; Dousse, Jean-Claude ; Hoszowska, Joanna ; Pajek, M. ; Barrett, R. ; Berset, Michel ; Fennane, Karima ; Kubala-Kukus, A. ; Szlachetko, Monika

In: Physical Review Letters, 2006, vol. 97, p. 073001

We report on the first high-resolution measurements of the K x-ray resonant Raman scattering (RRS) in Si. The measured x-ray RRS spectra, interpreted using the Kramers-Heisenberg approach, revealed spectral features corresponding to electronic excitations to the conduction and valence bands in silicon. The total cross sections for the x-ray RRS at the 1s absorption edge and the ...

Université de Fribourg

Resonant X-ray Raman scattering for Al, Si and their oxides

Szlachetko, Jakub ; Berset, Michel ; Dousse, Jean-Claude ; Fennane, Karima ; Szlachetko, Monika ; Barrett, R. ; Hoszowska, Joanna ; Kubala-Kukus, A. ; Pajek, M.

In: Nuclear Instruments and Methods in Physics Research B: Beam Interactions with Materials and Atoms, 2005, vol. 238, p. 353

High-resolution measurements of the resonant X-ray Raman scattering (RRS) of Al and Si and their oxides were performed at the European Synchrotron Radiation Facility (ESRF) in Grenoble, France, using a von Hamos Bragg-type curved crystal spectrometer. To probe the influence of chemical effects on the RRS X-ray spectra, Al₂O₃ and SiO₂ samples were also investigated. The X-ray RRS spectra...