In: Metallurgical and Materials Transactions A, 2015, vol. 46, no. 9, p. 4183-4190
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In: JOM, 2015, vol. 67, no. 5, p. 984-990
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In: JOM, 2015, vol. 67, no. 8, p. 1812-1820
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In: Metallurgical and Materials Transactions A, 2015, vol. 46, no. 1, p. 23-26
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In: The European Physical Journal A, 2015, vol. 51, no. 11, p. 1-10
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In: Journal of Materials Science, 2015, vol. 50, no. 14, p. 5091-5103
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In: Radiochimica Acta, 2017, vol. 105, no. 10, p. 801-811
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In: Advanced Optical Technologies, 2017, vol. 6, no. 6, p. 439-448
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In: JOM, 2015, vol. 67, no. 12, p. 2908-2913
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In: Journal of Analytical Atomic Spectrometry, 2019, vol. 34, no. 11, p. 2325–2332
We report on novel reference-free methods to determine the instrumental resolution of transmission-type bent crystal spectrometers. The novel methods are based on the measurements of a selected X-ray line in several orders of diffraction. It is shown that the angular broadening of the spectrometer and the natural linewidth of the selected transition can be obtained directly from the novel...
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