Affiner les résultats

Establishing nonlinearity thresholds with ultraintense X-ray pulses

Szlachetko, Jakub ; Hoszowska, Joanna ; Dousse, Jean-Claude ; Nachtegaal, Maarten ; Błachucki, Wojciech ; Kayser, Yves ; Sà, Jacinto ; Messerschmidt, Marc ; Boutet, Sebastien ; Williams, Garth J. ; David, Christian ; Smolentsev, Grigory ; Bokhoven, Jeroen A. van ; Patterson, Bruce D. ; Penfold, Thomas J. ; Knopp, Gregor ; Pajek, Marek ; Abela, Rafael ; Milne, Christopher J.

In: Scientific Reports, 2016, vol. 6, p. 33292

X-ray techniques have evolved over decades to become highly refined tools for a broad range of investigations. Importantly, these approaches rely on X-ray measurements that depend linearly on the number of incident X-ray photons. The advent of X-ray free electron lasers (XFELs) is opening the ability to reach extremely high photon numbers within ultrashort X-ray pulse durations and is leading...