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Remote Nanoimaging on Mars - Results of the Atomic Force Microscope Onboard NASA's Phoenix Mission

Gautsch, S. ; Parrat, D. ; de Rooij, N. ; Staufer, U. ; Marookian, J-M ; Hecht, M. ; Vijendran, S. ; Sykulska, H. ; Pike, W.

In: Microscopy and Microanalysis, 2011, vol. 17, no. S2, p. 864-865