In: Applied Physics A, 2009, vol. 97, no. 3, p. 543-547
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In: Calcified Tissue International, 1997, vol. 60, no. 1, p. 115-118
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In: Review of Scientific Instruments, 2014, vol. 85, no. 4, p. 043101
The high-resolution von Hamos bent crystal spectrometer of the University of Fribourg was upgraded with a focused X-ray beam source with the aim of performing micro-sized X-ray fluorescence (XRF) measurements in the laboratory. The focused X-ray beam source integrates a collimating optics mounted on a low-power micro-spot X-ray tube and a focusing polycapillary half-lens placed in front of the...
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