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In-house setup for laboratory-based x-ray absorption fine structure spectroscopy measurements

Zeeshan, Faisal ; Hoszowska, Joanna ; Loperetti-Tornay, L. ; Dousse, Jean-Claude

In: Review of Scientific Instruments, 2019, vol. 90, no. 7, p. 073105

We report on a laboratory-based facility for in-house x-ray absorption fine structure (XAFS) measurements. The device consists of a conventional x-ray source for the production of the incident polychromatic radiation and a von Hamos bent crystal spectrometer for the analysis of the incoming and transmitted radiation. The reliability of the laboratory-based setup was evaluated by comparing the...