Consortium of Swiss Academic Libraries

Integrating 3D Surface Imaging with FIB/SEM Microscopy

Volbert, B. ; Renka, G. ; Schock, K. ; Lieb, A. ; Dadras, M. ; Kleindiek, S.

In: Microscopy and Microanalysis, 2014, vol. 20, no. S3, p. 2066-2067