In: Physical Review A, 2009, vol. 80, no. 1, p. 012512
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In: Physical Review A, 2009, vol. 79, no. 3, p. 032708
This paper reports on the investigation of the double K-shell ionization of metallic aluminum induced by photon and electron impact. The experimental method consisted to measure the Kα hypersatellite spectra resulting from the radiative decay of double 1s vacancy states by means of high-resolution x-ray spectroscopy using a Bragg-type von Hamos crystal spectrometer....
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In: The European Physical Journal Special Topics, 2009, vol. 169, no. 1, p. 23-27
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In: The European Physical Journal: Special Topics, 2009, vol. 169, no. 1, p. 23-27
We report on the investigation of the photon energy dependence of double 1s photoionization of light atoms and compare the cross sections for hollow atom and He-like ion production. Measurements of the Kα hypersatellite x-ray spectra of Mg, Al, and Si were carried out using the Fribourg high-resolution x-ray spectrometer installed at the ID21 and ID26 beam lines at the ESRF. The...
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In: Nuclear Instruments and Methods in Physics Research B: Beam Interactions with Materials and Atoms, 2005, vol. 233(1-4), p. 235-239
The double 1s ionization of Si induced in collisions with protons and heavier ions (C, Ne) was studied by measuring the K X-ray emission of a solid Si target. In order to resolve the hypersatellite contributions in the spectra, high-resolution crystal diffractometry was employed yielding subelectronvolt energy resolution. Experimentally obtained hypersatellite yields were used to determine the...
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In: Physical Review Letters, 2009, vol. 102, no. 14, p. 143001
By means of a high resolution resonant inelastic x-ray scattering spectroscopy, we have for the first time separated spectral features pertaining to different two-electron atomic processes in the vicinity of an inner-shell threshold. Contributions of shakeoff, shakeup, and resonant 1s3p double excitations were extracted from the Ar KM-M2,3M...
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In: Physical Review A, 2004, vol. 70, p. 062720-62730
The satellite and hypersatellite K x-ray emission of a thin Mg foil and thick polycrystalline Si target bombarded by 34-MeV C and 50-MeV Ne ions was measured using high-resolution crystal diffractometry. The corresponding projectile reduced velocities v/vK were 1.09 and 0.92 for C ions and 1.02, 0.86 for Ne ions in case of Mg and Si targets, respectively. An energy resolution of approximately 0.5...
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In: Journal of Applied Physics, 2009, vol. 105, p. 086101
We report on the application of synchrotron radiation based high-resolution grazing-emission x-ray fluorescence (GEXRF) method to measure low-level impurities on silicon wafers. The presented high-resolution GEXRF technique leads to direct detection limits of about 10¹² atoms/cm². The latter can be presumably further improved down to 10⁷ atoms/cm² by combining the synchrotron...
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