Université de Fribourg

Surface-specific ordering of reverse micelles in confinement

Nygård, Kim ; Satapathy, Dillip K. ; Perret, Edith ; Padeste, Celestino ; Bunk, Oliver ; David, Christian ; Veen, J. Friso van der

In: Soft Matter, 2010, vol. 6, no. 18, p. 4536-4539

We have applied holographic X-ray diffraction from fluid-filled channel arrays for model-independent density reconstruction of spherical AOT/water/isooctane reverse micelles (average diameter σ***Missing image substitution***12–13 nm) confined between planar surfaces. We find the confinement-induced ordering of the reverse micelles to strongly depend on the surface potential of the...

Université de Fribourg

X-ray reflectivity theory for determining the density profile of a liquid under nanometre confinement

Perret, Edith ; Nygård, Kim ; Satapathy, Dillip K ; Balmer, Tobias E ; Bunk, Oliver ; Heuberger, Manfred ; Veen, J Friso van der

In: Journal of Synchrotron Radiation, 2010, vol. 17, no. 4, p. 465-472

An X-ray reflectivity theory on the determination of the density profile of a molecular liquid under nanometre confinement is presented. The confinement geometry acts like an X-ray interferometer, which consists of two opposing atomically flat single-crystal mica membranes with an intervening thin liquid film of variable thickness. The X-rays reflected from the parallel crystal planes (of known...

Université de Fribourg

Molecular liquid under nanometre confinement: density profiles underlying oscillatory forces

Perret, Edith ; Nygård, Kim ; Satapathy, Dillip K ; Balmer, Tobias E ; Bunk, Oliver ; Heuberger, Manfred ; Veen, J Friso van der

In: Journal of Physics: Condensed Matter, 2010, vol. 22, no. 23, p. 235102

Ultrathin (<12 nm) films of tetrakis(trimethyl)siloxysilane (TTMSS) have been confined by atomically flat mica membranes in the presence and absence of applied normal forces. When applying normal forces, discrete film thickness transitions occur, each involving the expulsion of TTMSS molecules. Using optical interferometry we have measured the step size associated with a film thickness transition...