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Consortium of Swiss Academic Libraries

In situ compression tests on micron-sized silicon pillars by Raman microscopy—Stress measurements and deformation analysis

Wasmer, K. ; Wermelinger, T. ; Bidiville, A. ; Spolenak, R. ; Michler, J.

In: Journal of Materials Research, 2008, vol. 23, no. 11, p. 3040-3047

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