Université de Fribourg

Double K-shell photoionization of low-Z atoms and He-like ions

Hoszowska, Joanna ; Kheifets, A. S. ; Berset, Michel ; Bray, I. ; Cao, Wei ; Dousse, Jean-Claude ; Fennane, Karima ; Kavčič, M. ; Kayser, Yves ; Szlachetko, Jakub ; Szlachetko, Monika

In: The European Physical Journal: Special Topics, 2009, vol. 169, no. 1, p. 23-27

We report on the investigation of the photon energy dependence of double 1s photoionization of light atoms and compare the cross sections for hollow atom and He-like ion production. Measurements of the Kα hypersatellite x-ray spectra of Mg, Al, and Si were carried out using the Fribourg high-resolution x-ray spectrometer installed at the ID21 and ID26 beam lines at the ESRF. The...

Université de Fribourg

Double K-shell ionization of Al induced by photon and electron impact

Fennane, Karima ; Dousse, Jean-Claude ; Hoszowska, Joanna ; Berset, Michel ; Cao, Wei ; Maillard, Yves-Patrick ; Szlachetko, Jakub ; Szlachetko, Monika ; Kavčič, M.

In: Physical Review A, 2009, vol. 79, no. 3, p. 032708

This paper reports on the investigation of the double K-shell ionization of metallic aluminum induced by photon and electron impact. The experimental method consisted to measure the Kα hypersatellite spectra resulting from the radiative decay of double 1s vacancy states by means of high-resolution x-ray spectroscopy using a Bragg-type von Hamos crystal spectrometer....

Université de Fribourg

Application of the high-resolution grazing-emission x-ray fluorescence method for impurities control in semiconductor nanotechnology

Szlachetko, Jakub ; Banaś, D. ; Kubala-Kukuś, A. ; Pajek, M. ; Cao, Wei ; Dousse, Jean-Claude ; Hoszowska, Joanna ; Kayser, Yves ; Szlachetko, Monika ; Kavčič, M. ; Salome, M. ; Susini, J.

In: Journal of Applied Physics, 2009, vol. 105, p. 086101

We report on the application of synchrotron radiation based high-resolution grazing-emission x-ray fluorescence (GEXRF) method to measure low-level impurities on silicon wafers. The presented high-resolution GEXRF technique leads to direct detection limits of about 10¹² atoms/cm². The latter can be presumably further improved down to 10⁷ atoms/cm² by combining the synchrotron...

Université de Fribourg

Separation of two-electron photoexcited atomic processes near the inner-shell threshold

Kavčič, M. ; Žitnik, M. ; Bučar, K. ; Mihelič, A. ; Štuhec, M. ; Szlachetko, Jakub ; Cao, Wei ; Mori, R. Alonso ; Glatzel, P.

In: Physical Review Letters, 2009, vol. 102, no. 14, p. 143001

By means of a high resolution resonant inelastic x-ray scattering spectroscopy, we have for the first time separated spectral features pertaining to different two-electron atomic processes in the vicinity of an inner-shell threshold. Contributions of shakeoff, shakeup, and resonant 1s3p double excitations were extracted from the Ar KM-M2,3M...

Université de Fribourg

Double 1s shell ionization of Si induced in collisions with protons and heavy ions

Kavčič, M. ; Kobal, M. ; Budnar, M. ; Dousse, Jean-Claude ; Tökési, K.

In: Nuclear Instruments and Methods in Physics Research B: Beam Interactions with Materials and Atoms, 2005, vol. 233(1-4), p. 235-239

The double 1s ionization of Si induced in collisions with protons and heavier ions (C, Ne) was studied by measuring the K X-ray emission of a solid Si target. In order to resolve the hypersatellite contributions in the spectra, high-resolution crystal diffractometry was employed yielding subelectronvolt energy resolution. Experimentally obtained hypersatellite yields were used to determine the...

Université de Fribourg

Double-K-shell ionization of Mg and Si induced in collisions with C and Ne ions

Kobal, M. ; Kavčič, M. ; Budnar, M. ; Dousse, Jean-Claude ; Maillard, Yves-Patrick ; Mauron, Olivier ; Raboud, Pierre-Alexandre ; Tökési, K.

In: Physical Review A, 2004, vol. 70, p. 062720-62730

The satellite and hypersatellite K x-ray emission of a thin Mg foil and thick polycrystalline Si target bombarded by 34-MeV C and 50-MeV Ne ions was measured using high-resolution crystal diffractometry. The corresponding projectile reduced velocities v/vK were 1.09 and 0.92 for C ions and 1.02, 0.86 for Ne ions in case of Mg and Si targets, respectively. An energy resolution of approximately 0.5...