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Université de Fribourg

Novel reference-free methods for the determination of the instrumental response of Laue-type bent crystal spectrometers

Szlachetko, Monika ; Hoszowska, Joanna ; Szlachetko, Jakub ; Dousse, Jean-Claude

In: Journal of Analytical Atomic Spectrometry, 2019, vol. 34, no. 11, p. 2325–2332

We report on novel reference-free methods to determine the instrumental resolution of transmission-type bent crystal spectrometers. The novel methods are based on the measurements of a selected X-ray line in several orders of diffraction. It is shown that the angular broadening of the spectrometer and the natural linewidth of the selected transition can be obtained directly from the novel...

Université de Fribourg

Diagram, valence-to-core, and hypersatellite Kβ X-ray transitions in metallic chromium

Zeeshan, Faisal ; Hoszowska, Joanna ; Dousse, Jean-Claude ; Sokaras, Dimosthenis ; Weng, Tsu-Chien ; Alonso-Mori, Roberto ; Kavčič, Matjaz ; Guerra, Mauro ; Sampaio, Jorge Miguel ; Parente, Fernando ; Indelicato, Paul ; Marques, José Pires ; Santos, José Paulo

In: X-Ray Spectrometry, 2019, vol. 48, no. 5, p. 351–359

We report on measurements of the Kβ diagram, valence‐to‐core (VtC), and hypersatellite X‐ray spectra induced in metallic Cr by photon single and double K‐shell ionization. The experiment was carried out at the Stanford Synchrotron Radiation Lightsource using the seven‐crystal Johann‐type hard X‐ray spectrometer of the beamline 6‐2. For the Kβ diagram and VtC transitions, the...

Université de Fribourg

Metallic contact between MoS2 and Ni via Au nanoglue

Shi, Xinying ; Posysaev, Sergei ; Huttula, Marko ; Pankratov, Vladimir ; Hoszowska, Joanna ; Dousse, Jean-Claude ; Zeeshan, Faisal ; Niu, Yuran ; Zakharov, Alexei ; Li, Taohai ; Miroshnichenko, Olga ; Zhang, Meng ; Wang, Xiao ; Huang, Zhongjia ; Saukko, Sami ; González, Diego López ; Dijken, Sebastiaan van ; Alatalo, Matti ; Cao, Wei

In: Small, 2018, vol. 14, no. 22, p. 1704526

A critical factor for electronics based on inorganic layered crystals stems from the electrical contact mode between the semiconducting crystals and the metal counterparts in the electric circuit. Here, a materials tailoring strategy via nanocomposite decoration is carried out to reach metallic contact between MoS2 matrix and transition metal nanoparticles. Nickel nanoparticles (NiNPs) are ...

Université de Fribourg

Lifetimes of doubly K -shell ionized states

Polasik, M . ; Słabkowska, K. ; Kozioł, K. ; Starosta, J. ; Dousse, Jean-Claude ; Hoszowska, Joanna ; Rzadkiewicz, J.

In: Physica Scripta, 2011, vol. 2011, no. T144, p. 014021

The present work provides a reliable interpretation of the Khα₁/Khα₂ intensity ratios and an explanation of the lifetime values for K-shell hollow atoms based on an advanced theoretical analysis (using extensive multiconfiguration Dirac–Fock calculations with the inclusion of the transverse Breit interaction and quantum electrodynamics ...

Université de Fribourg

Crystal optics for hard-X-ray spectroscopy of highly charged ions

Beyer, H.F. ; Attia, D. ; Banas, D. ; Bigot, E.-O. Le ; Bosch, F. ; Dousse, Jean-Claude ; Förster, E. ; Gumberidze, A. ; Hagmann, S. ; Heß, S. ; Hoszowska, Joanna ; Indelicato, P. ; Jagodzinski, P. ; Kozhuharov, Chr. ; Krings, Th. ; Liesen, D. ; Ma, X. ; Manil, B. ; Mohos, I. ; Pajek, M. ; Protić, D. ; Reuschl, R. ; Rzadkiewicz, J. ; Simionovici, A. ; Spillmann, U. ; Stachura, Z. ; Stöhlker, Th. ; Trassinelli, M. ; Trotsenko, S. ; Warczak, A. ; Wehrhan, O. ; Ziegler, E.

In: Spectrochimica Acta Part B: Atomic Spectroscopy, 2009, vol. 64, no. 8, p. 736-743

A twin crystal-spectrometer assembly, operated in the focusing compensated asymmetric Laue geometry has been developed for accurate spectroscopy of fast highly charged heavy ions in the hard-X-ray region. Coupled to the focusing crystal optics is a specially developed two-dimensional position-sensitive X-ray detector which is necessary for retaining spectral resolution also for fast moving...

Université de Fribourg

Vacancy rearrangement processes in multiply ionized atoms

Czarnota, M. ; Pajek, M. ; Banas, D. ; Dousse, Jean-Claude ; Maillard, Yves-Patrick ; Mauron, Olivier ; Raboud, Pierre-Alexandre ; Berset, Michel ; Hoszowska, Joanna ; Slabkowska, K. ; Polasik, M. ; Chmielewska, D. ; Rzadkiewicz, J. ; Sujkowski, Z.

In: Journal of Physics: Conference Series, 2007, vol. 58, no. 1, p. 295

We demonstrate that in order to interpret the x-ray satellite structure of Pd Lα1,2(L₃M4,5) transitions excited by fast O ions, which was measured using a high-resolution von Hamos crystal spectrometer, the vacancy rearrangement processes, taking place prior to the x-ray emission, have to be taken into account. The measured spectra were compared with the predictions...

Université de Fribourg

High-resolution study of x-ray resonant Raman scattering at the k edge of silicon

Szlachetko, Jakub ; Dousse, Jean-Claude ; Hoszowska, Joanna ; Pajek, M. ; Barrett, R. ; Berset, Michel ; Fennane, Karima ; Kubala-Kukus, A. ; Szlachetko, Monika

In: Physical Review Letters, 2006, vol. 97, p. 073001

We report on the first high-resolution measurements of the K x-ray resonant Raman scattering (RRS) in Si. The measured x-ray RRS spectra, interpreted using the Kramers-Heisenberg approach, revealed spectral features corresponding to electronic excitations to the conduction and valence bands in silicon. The total cross sections for the x-ray RRS at the 1s absorption edge and the ...

Université de Fribourg

Resonant X-ray Raman scattering for Al, Si and their oxides

Szlachetko, Jakub ; Berset, Michel ; Dousse, Jean-Claude ; Fennane, Karima ; Szlachetko, Monika ; Barrett, R. ; Hoszowska, Joanna ; Kubala-Kukus, A. ; Pajek, M.

In: Nuclear Instruments and Methods in Physics Research B: Beam Interactions with Materials and Atoms, 2005, vol. 238, p. 353

High-resolution measurements of the resonant X-ray Raman scattering (RRS) of Al and Si and their oxides were performed at the European Synchrotron Radiation Facility (ESRF) in Grenoble, France, using a von Hamos Bragg-type curved crystal spectrometer. To probe the influence of chemical effects on the RRS X-ray spectra, Al₂O₃ and SiO₂ samples were also investigated. The X-ray RRS spectra...

Université de Fribourg

Natural widths of hypersatellite K-X-ray lines and lifetimes of double K-hole states in mid-Z atoms

Rzadkiewicz, J. ; Chmielewska, D. ; Sujkowski, Z. ; Berset, Michel ; Dousse, Jean-Claude ; Maillard, Yves-Patrick ; Mauron, Olivier ; Raboud, Pierre-Alexandre ; Polasik, M. ; Słabkowska, K. ; Hoszowska, Joanna ; Pajek, M.

In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2005, vol. 235 (1-4), p. 110-115

K-X-ray spectra of Zr, Nb, Mo and Pd targets bombarded with 250 MeV carbon and 360 MeV oxygen ions are studied with high resolution diffraction spectrometry. Relative yields and natural widths of the Khα1,2 hypersatellite lines are determined and compared with those of the diagram lines. The widths of Khα1,2 lines are compared with the new ...

Université de Fribourg

High-resolution XES and RIXS studies with a von Hamos Bragg crystal spectrometer

Hoszowska, Joanna ; Dousse, Jean-Claude

In: Journal of Electron Spectroscopy and Related Phenomena, 2004, vol. 137-140, p. 687-690

The high-resolution von Hamos Bragg crystal spectrometer was constructed for the study of K X-ray emission from low-Z elements and L and M X-ray spectra of medium to high Z elements. Recently, this instrument was applied to high-resolution XES and RIXS studies using X-ray synchrotron radiation at the ID21 and BM5 beamlines at the ESRF. An outline of the spectrometer design and performance...