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Coherent diffractive imaging methods for semiconductor manufacturing

Helfenstein, Patrick ; Mochi, Iacopo ; Rajeev, Rajendran ; Fernandez, Sara ; Ekinci, Yasin

In: Advanced Optical Technologies, 2017, vol. 6, no. 6, p. 439-448

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    Titre
    • Coherent diffractive imaging methods for semiconductor manufacturing
    Auteur
    • Helfenstein, Patrick. Paul Scherrer Institute, Villigen, Switzerland
    • Mochi, Iacopo. Paul Scherrer Institute, Villigen, Switzerland
    • Rajeev, Rajendran. Paul Scherrer Institute, Villigen, Switzerland
    • Fernandez, Sara. Paul Scherrer Institute, Villigen, Switzerland
    • Ekinci, Yasin. Paul Scherrer Institute, Villigen, Switzerland
    Type de document
    • Postprint
    Langue
    • Inglese
    Publié dans
    • Advanced Optical Technologies, 2017, vol. 6, no. 6, p. 439-448. De Gruyter
    Autre version électronique
    Identifiant OAI-PMH
    • oai:doc.rero.ch:331073
    Summary
    The paradigm shift of the semiconductor industry moving from deep ultraviolet to extreme ultraviolet lithography (EUVL) brought about new challenges in the fabrication of illumination and projection optics, which constitute one of the core sources of cost of ownership for many of the metrology tools needed in the lithography process. For this reason, lensless imaging techniques based on coherent diffractive imaging started to raise interest in the EUVL community. This paper presents an overview of currently on-going research endeavors that use a number of methods based on lensless imaging with coherent light.