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Photon path length distribution in random media from spectral speckle intensity correlations

Rojas, L. ; Bina, M. ; Cerchiari, G. ; Escobedo-Sánchez, M. ; Ferri, F. ; Scheffold, F.

In: The European Physical Journal Special Topics, 2011, vol. 199, no. 1, p. 167-180

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    Titre
    • Photon path length distribution in random media from spectral speckle intensity correlations
    Auteur
    • Rojas, L.. Departamento de Física, Cinvestav-IPN, Av. Instituto Politécnico Nacional 2508, 07360, México D.F., México
    • Bina, M.. Dipartimento di Fisica e Matematica, Università degli Studi dell'Insubria, via Valleggio 11, 22100, Como, Italy
    • Cerchiari, G.. Dipartimento di Fisica, Università degli studi di Milano, via Celoria 16, 20133, Milano, Italy
    • Escobedo-Sánchez, M.. Departamento de Física, Cinvestav-IPN, Av. Instituto Politécnico Nacional 2508, 07360, México D.F., México
    • Ferri, F.. Dipartimento di Fisica e Matematica, Università degli Studi dell'Insubria, via Valleggio 11, 22100, Como, Italy
    • Scheffold, F.. Department of Physics and Fribourg Center for Nanomaterials, University of Fribourg, 1700, Fribourg, Switzerland
    Type de document
    • Postprint
    Langue
    • Inglese
    Publié dans
    • The European Physical Journal Special Topics, 2011, vol. 199, no. 1, p. 167-180. Springer-Verlag
    Autre version électronique
    Classification
    • Physique
    Identifiant OAI-PMH
    • oai:doc.rero.ch:318493
    Summary
    We show that the spectral speckle intensity correlation (SSIC) technique can be profitably exploited to recover the path length distribution of photons scattered in a random turbid medium. We applied SSIC to the study of Teflon slabs of different thicknesses and were able to recover, via the use of the photon diffusion approximation theory, the characteristic transport mean free path ℓ∗ and absorption length s a of the medium. These results were compared and validated by means of complementary measurements performed on the same samples with standard pulsed laser time of flight techniques