X-ray photoelectron diffraction study of ultrathin PbTiO3 films

Despont, L. ; Lichtensteiger, C. ; Clerc, F. ; Garnier, M. G. ; Garcia de Abajo, F.J. ; Van Hove, M. A. ; Triscone, J.-M ; Aebi, P.

In: The European Physical Journal B - Condensed Matter and Complex Systems, 2006, vol. 49, no. 2, p. 141-146

Aggiungi alla tua lista
    Summary
    Abstract.: Full hemispherical X-ray photoelectron diffraction (XPD) experiments have been performed to investigate at the atomic level ultrathin epitaxial c-axis oriented PbTiO3 (PTO) films grown on Nb-doped SrTiO3 substrates. Comparison between experiment and theory allows us to identify a preferential ferroelectric polarization state in a 60 Å -thick PTO film. Multiple scattering theory based on a cluster-model [ Phys. Rev. B $\textbf{63}$ , 075404 (2001)] is used to simulate the experiments