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Investigation of 6TSWCNT by Cs-Corrected Transmission Electron Microscopy

Bártová, B. ; Lazar, S. ; Botton, GA ; Milko, M. ; Hébert, C.

In: Microscopy and Microanalysis, 2009, vol. 15, no. S2, p. 1334-1335

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    Title
    • Investigation of 6TSWCNT by Cs-Corrected Transmission Electron Microscopy
    Author
    • Bártová, B.. Ecole Polytechnique Federale de Lausanne,Switzerland
    • Lazar, S.. FEI Electron Optics,Netherlands
    • Botton, GA. McMaster University,Canada
    • Milko, M.. University of Leoben,Austria
    • Hébert, C.. Ecole Polytechnique Federale de Lausanne,Switzerland
    Document Type
    • Postprint
    Language
    • English
    Published in
    • Microscopy and Microanalysis, 2009, vol. 15, no. S2, p. 1334-1335. Cambridge University Press
    Other Version
    OAI-PMH Identifier
    • oai:doc.rero.ch:303839
    Summary
    Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 - July 30, 2009