FIB-SEM Nanotomography in Materials and Life Science at EPFL

Cantoni, M. ; Knott, G. ; Hébert, C.

In: Microscopy and Microanalysis, 2010, vol. 16, no. S2, p. 226-227

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    Summary
    Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 - August 5, 2010