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Transmission-electron-microscopy study of quasi-epitaxial tungsten-bronze (Sr2.5Ba2.5Nb10O30) thin film on perovskite (SrTiO3) single crystal

Su, Dong ; Infortuna, Anna ; Muralt, Paul ; Setter, Nava ; Cantoni, Marco

In: Journal of Materials Research, 2007, vol. 22, no. 1, p. 157-163

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    Titre
    • Transmission-electron-microscopy study of quasi-epitaxial tungsten-bronze (Sr2.5Ba2.5Nb10O30) thin film on perovskite (SrTiO3) single crystal
    Auteur
    • Su, Dong. Ceramics Laboratory, Swiss Federal Institute of Technology (EPFL), Lausanne CH-1015, Switzerland
    • Infortuna, Anna. Ceramics Laboratory, Swiss Federal Institute of Technology (EPFL), Lausanne CH-1015, Switzerland
    • Muralt, Paul. Ceramics Laboratory, Swiss Federal Institute of Technology (EPFL), Lausanne CH-1015, Switzerland
    • Setter, Nava. Ceramics Laboratory, Swiss Federal Institute of Technology (EPFL), Lausanne CH-1015, Switzerland
    • Cantoni, Marco. Interdisciplinary Center for Electron Microscopy (CIME), Swiss Federal Institute of Technology (EPFL), Lausanne CH-1015, Switzerland
    Type de document
    • Postprint
    Langue
    • Inglese
    Publié dans
    • Journal of Materials Research, 2007, vol. 22, no. 1, p. 157-163. Cambridge University Press
    Autre version électronique
    Identifiant OAI-PMH
    • oai:doc.rero.ch:290614
    Summary
    Strontium barium niobate (Sr2.5Ba2.5Nb10O30) thin films were deposited on (001) SrTiO3 single-crystalline substrates by pulsed laser deposition. The growth nature was investigated by transmission electron microscopy (TEM). Selected-area electron diffraction and high-resolution transmission electron microscopy revealed the existence of six types of grains. These grains grew on the substrate in a partially epitaxial fashion. Geometrical models were built, which were confirmed by TEM observations. Based on the TEM results and geometrical analysis, a crystallographic model was developed. The strain nature resulting from the growth columns is discussed in this report