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Mapping Polarization Fields in Al0.85In0.15N/AlN/GaN Heterostructures

Zhou, L. ; Cullen, DA ; Smith, DJ ; Mouti, A. ; Gonschorek, M. ; Feltin, E. ; Carlin, JF ; Grandjean, N. ; McCartney, MR

In: Microscopy and Microanalysis, 2009, vol. 15, no. S2, p. 1048-1049

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    Title
    • Mapping Polarization Fields in Al0.85In0.15N/AlN/GaN Heterostructures
    Author
    • Zhou, L.. Arizona State University
    • Cullen, DA. Arizona State University
    • Smith, DJ. Arizona State University
    • Mouti, A.. École Polytechnique Fédérale de Lausanne,Switzerland
    • Gonschorek, M.. École Polytechnique Fédérale de Lausanne,Switzerland
    • Feltin, E.. École Polytechnique Fédérale de Lausanne,Switzerland
    • Carlin, JF. École Polytechnique Fédérale de Lausanne,Switzerland
    • Grandjean, N.. École Polytechnique Fédérale de Lausanne,Switzerland
    • McCartney, MR. Arizona State University
    Document Type
    • Postprint
    Language
    • English
    Published in
    • Microscopy and Microanalysis, 2009, vol. 15, no. S2, p. 1048-1049. Cambridge University Press
    Other Version
    OAI-PMH Identifier
    • oai:doc.rero.ch:289295
    Summary
    Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 - July 30, 2009