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Université de Neuchâtel

High Resolution Interference Microscopy: A Tool for Probing Optical Waves in the Far-Field on a Nanometric Length Scale

Rockstuhl, Carsten ; Märki, Iwan ; Scharf, Toralf ; Salt, Martin Guy ; Herzig, Hans-Peter ; Dändliker, René

In: Current Nanoscience, 2006, vol. 2, no. 4, p. 337-350

High Resolution Interference Microscopy (HRIM) is a technique that allows the characterization of amplitude and phase of electromagnetic wave-fields in the far-field with a spatial accuracy that corresponds to a few nanometers in the object plane. Emphasis is put on the precise determination of topological features in the wave-field, called phase singularities or vortices, which are spatial...

Université de Neuchâtel

Practical and theoretical modal analysis of photonic crystal waveguides

Märki, Iwan ; Salt, Martin Guy ; Herzig, Hans-Peter

In: Journal of Applied Physics, 2004, vol. 96, no. 1, p. 7-11

We present practical and theoretical, stage-by-stage analysis of light propagation around a 90° corner in a two-dimensional photonic crystal waveguide. Using a series of different samples we quantify the coupling efficiency between the conventional ridge waveguide and the photonic crystal waveguide as well as the bending efficiency around the 90° corner. From this, the transmission spectra...

Université de Neuchâtel

Characterization of buried photonic crystal waveguides and microcavities fabricated by deep ultraviolet lithography

Märki, Iwan ; Salt, Martin Guy ; Herzig, Hans-Peter ; Stanley, Ross ; El Melhaoui, L. ; Lyan, P. ; Fedeli, J. M.

In: Applied Physics Letters, 2005, vol. 98, no. 013103, p. 1-4

We present results of the optical characterization of silicon photonic crystal waveguides and microcavities that are completely buried in a silicon dioxide cladding and are fabricated by deep ultraviolet (UV) lithography. The advantages of buried waveguides and deep UV lithography are discussed. Transmission spectra and loss factors for photonic crystal waveguides, as well as quality factors for...