In: Physical Review A, 2011, vol. 83, no. 4, p. 042513
The KMM radiative Auger (RA) x-ray spectra of solid Ca were induced by monochromatic synchrotron radiation and measured with a high-resolution von Hamos bent crystal spectrometer. Two excitation energies were employed, one in the near K threshold region and the second well above the K absorption edge. The KMM RA spectral structure and relative intensity with respect to the diagram ...
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In: Physical Review A, 2009, vol. 79, no. 3, p. 032708
This paper reports on the investigation of the double K-shell ionization of metallic aluminum induced by photon and electron impact. The experimental method consisted to measure the Kα hypersatellite spectra resulting from the radiative decay of double 1s vacancy states by means of high-resolution x-ray spectroscopy using a Bragg-type von Hamos crystal spectrometer....
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In: Physical Review A, 2007, vol. 75, no. 2, p. 022512
X-ray resonant Raman scattering (RRS) spectra of Al, Al₂O₃, Si, and SiO₂ were measured at the European Synchrotron Radiation Facility, using a high-resolution Bragg-type curved crystal spectrometer. The x-ray RRS spectra were collected at several beam energies tuned below the 1s absorption thresholds of Al and Si. Differences in the spectral features between the elemental samples and...
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In: Physical Review Letters, 2006, vol. 97, p. 073001
We report on the first high-resolution measurements of the K x-ray resonant Raman scattering (RRS) in Si. The measured x-ray RRS spectra, interpreted using the Kramers-Heisenberg approach, revealed spectral features corresponding to electronic excitations to the conduction and valence bands in silicon. The total cross sections for the x-ray RRS at the 1s absorption edge and the ...
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In: Nuclear Instruments and Methods in Physics Research B: Beam Interactions with Materials and Atoms, 2005, vol. 238, p. 353
High-resolution measurements of the resonant X-ray Raman scattering (RRS) of Al and Si and their oxides were performed at the European Synchrotron Radiation Facility (ESRF) in Grenoble, France, using a von Hamos Bragg-type curved crystal spectrometer. To probe the influence of chemical effects on the RRS X-ray spectra, Al₂O₃ and SiO₂ samples were also investigated. The X-ray RRS spectra...
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