In: Physical Review A, 2007, vol. 75, no. 2, p. 022512
X-ray resonant Raman scattering (RRS) spectra of Al, Al₂O₃, Si, and SiO₂ were measured at the European Synchrotron Radiation Facility, using a high-resolution Bragg-type curved crystal spectrometer. The x-ray RRS spectra were collected at several beam energies tuned below the 1s absorption thresholds of Al and Si. Differences in the spectral features between the elemental samples and...
|
In: Physical Review Letters, 2006, vol. 97, p. 073001
We report on the first high-resolution measurements of the K x-ray resonant Raman scattering (RRS) in Si. The measured x-ray RRS spectra, interpreted using the Kramers-Heisenberg approach, revealed spectral features corresponding to electronic excitations to the conduction and valence bands in silicon. The total cross sections for the x-ray RRS at the 1s absorption edge and the ...
|
