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Grazing angle X-ray fluorescence from periodic structures on silicon and silica surfaces

Nowak, Stanislaw H. ; Banaś, D. ; Błachucki, Wojciech Maria ; Cao, Wei ; Dousse, Jean-Claude ; Hönicke, P. ; Hoszowska, Joanna ; Jabłoński, Ł. ; Kayser, Yves ; Kubala-Kukuś, A. ; Pajek, M. ; Reinhardt, F. ; Savu, A.V. ; Szlachetko, Jakub

In: Spectrochimica Acta Part B: Atomic Spectroscopy, 2014, vol. 98, p. 65-75

Various 3-dimensional nano-scaled periodic structures with different configurations and periods deposited on the surface of silicon and silica substrates were investigated by means of the grazing incidence and grazing emission X-ray fluorescence techniques. Apart from the characteristics which are typical for particle- and layer-like samples, the measured angular intensity profiles show...

L-subshell Coster-Kronig rates of Pd and Xe, electron-induced L3M double ionization of Pd, and KMM RAE of Ca investigated by means of high-resolution x-ray spectroscopy

Cao, Wei ; Dousse, Jean-Claude (Dir.)

Thèse de doctorat : Université de Fribourg, 2010 ; no 1696.

Investigation of surface nanostructures with grazing angle x-ray fluorescence techniques

Nowak, Stanisław H. ; Dousse, Jean-Claude (Dir.)

Thèse de doctorat : Université de Fribourg, 2012 ; no. 1768.

La présente thèse de doctorat a été réalisée au Département de Physique de l’Université de Fribourg dans le groupe de recherche « Atomic and X-Ray Physics » (AXP) du Prof. Jean-Claude Dousse. Elle est consacrée au développement de méthodes d’analyse basées sur la fluorescence X en haute-résolution et à angles rasants, plus spécifiquement la fluorescence X à émission rasante...

Depth profiling of dopants implanted in Si using the synchrotron radiation based high-resolution grazing emission technique

Kayser, Yves ; Banaś, D. ; Cao, Wei ; Dousse, Jean-Claude ; Hoszowska, Joanna ; Jagodziński, P. ; Kavčič, Matjaz ; Kubala-Kukuś, A. ; Nowak, S. ; Pajek, M. ; Szlachetko, Jakub

In: X-Ray Spectrometry, 2012, vol. 41, no. 2, p. 98-104

We report on the surface-sensitive grazing emission X-ray fluorescence technique combined with synchrotron radiation excitation and high-resolution detection to realize depth-profile measurements of Al-implanted Si wafers. The principles of grazing emission measurements as well as the benefits offered by synchrotron sources and wavelength-dispersive detection setups are presented. It is shown...