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Université de Fribourg

High energy resolution measurements of the radiative decay of double K-shell vacancies in 20 ≤ Z ≤ 29 elements bombarded by fast C and Ne ions

Dousse, Jean-Claude ; Maillard, Yves-Patrick ; Berset, Michel ; Castella, D. ; Hoszowska, Joanna ; Kavčič, Matjaz ; Kobal, M. ; Mauron, Olivier ; Muehleisen, A. ; Raboud, Pierre-Alexandre ; Rzadkiewicz, J. ; Tökési, K. ; Zorko, B.

In: Journal of Physics: Conference Series, 2015, vol. 635, no. 2, p. 022054

We report on high energy resolution measurements of the Kα hypersatellite x-ray spectra of Ca, V, Fe and Cu induced by impact with 144 MeV C and 180 MeV Ne ions.

Université de Fribourg

Double K-shell photoionization of low-Z atoms and He-like ions

Hoszowska, Joanna ; Kheifets, A. S. ; Berset, Michel ; Bray, I. ; Cao, Wei ; Dousse, Jean-Claude ; Fennane, Karima ; Kavčič, M. ; Kayser, Yves ; Szlachetko, Jakub ; Szlachetko, Monika

In: The European Physical Journal: Special Topics, 2009, vol. 169, no. 1, p. 23-27

We report on the investigation of the photon energy dependence of double 1s photoionization of light atoms and compare the cross sections for hollow atom and He-like ion production. Measurements of the Kα hypersatellite x-ray spectra of Mg, Al, and Si were carried out using the Fribourg high-resolution x-ray spectrometer installed at the ID21 and ID26 beam lines at the ESRF. The...

Université de Fribourg

Physical mechanisms and scaling laws of K-shell double photoionization

Hoszowska, Joanna ; Kheifets, A. K. ; Dousse, Jean-Claude ; Berset, Michel ; Bray, I. ; Cao, Wei ; Fennane, Karima ; Kayser, Yves ; Kavčič, Matjaz ; Szlachetko, Jakub ; Szlachetko, Monika

In: Physical Review Letters, 2009, vol. 102, no. 7, p. 073006

We report on the photon energy dependence of the K-shell double photoionization (DPI) of Mg, Al, and Si. The DPI cross sections were derived from high-resolution measurements of x-ray spectra following the radiative decay of the K-shell double vacancy states. Our data evince the relative importance of the final-state electron- electron interaction to the DPI. By comparing the double-to-single...

Université de Fribourg

High-resolution study of the x-ray resonant Raman scattering process around the 1s absorption edge for aluminium, silicon, and their oxides

Szlachetko, Jakub ; Dousse, Jean-Claude ; Berset, Michel ; Fennane, Karima ; Szlachetko, Monika ; Hoszowska, Joanna ; Barrett, R. ; Pajek, M. ; Kubala-Kukus, A.

In: Physical Review A, 2007, vol. 75, no. 2, p. 022512

X-ray resonant Raman scattering (RRS) spectra of Al, Al₂O₃, Si, and SiO₂ were measured at the European Synchrotron Radiation Facility, using a high-resolution Bragg-type curved crystal spectrometer. The x-ray RRS spectra were collected at several beam energies tuned below the 1s absorption thresholds of Al and Si. Differences in the spectral features between the elemental samples and...

Université de Fribourg

High-resolution study of x-ray resonant Raman scattering at the k edge of silicon

Szlachetko, Jakub ; Dousse, Jean-Claude ; Hoszowska, Joanna ; Pajek, M. ; Barrett, R. ; Berset, Michel ; Fennane, Karima ; Kubala-Kukus, A. ; Szlachetko, Monika

In: Physical Review Letters, 2006, vol. 97, p. 073001

We report on the first high-resolution measurements of the K x-ray resonant Raman scattering (RRS) in Si. The measured x-ray RRS spectra, interpreted using the Kramers-Heisenberg approach, revealed spectral features corresponding to electronic excitations to the conduction and valence bands in silicon. The total cross sections for the x-ray RRS at the 1s absorption edge and the ...

Université de Fribourg

Resonant X-ray Raman scattering for Al, Si and their oxides

Szlachetko, Jakub ; Berset, Michel ; Dousse, Jean-Claude ; Fennane, Karima ; Szlachetko, Monika ; Barrett, R. ; Hoszowska, Joanna ; Kubala-Kukus, A. ; Pajek, M.

In: Nuclear Instruments and Methods in Physics Research B: Beam Interactions with Materials and Atoms, 2005, vol. 238, p. 353

High-resolution measurements of the resonant X-ray Raman scattering (RRS) of Al and Si and their oxides were performed at the European Synchrotron Radiation Facility (ESRF) in Grenoble, France, using a von Hamos Bragg-type curved crystal spectrometer. To probe the influence of chemical effects on the RRS X-ray spectra, Al₂O₃ and SiO₂ samples were also investigated. The X-ray RRS spectra...

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