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    Université de Fribourg

    Electronic state characterization of SiOx thin films prepared by evaporation

    Barranco, Angel ; Yubero, F. ; Espinós, J. P. ; Gröning, Pierangelo ; González-Elipe, A. R.

    In: Journal of Applied Physics, 2005, vol. 97, p. 113714

    SiOx thin films with different stoichiometries from SiO1.3 to SiO1.8 have been prepared by evaporation of silicon monoxide in vacuum or under well-controlled partial pressures of oxygen (PK and...