In: Journal of Physics: Conference Series, 2007, vol. 58, no. 1, p. 411-414
We report on a first prototype 2D μ-strip germanium detector, developed at IKP-Jülich, and its performance test at the European Synchrotron Radiation Facility (ESRF) in Grenoble, France. Beside an accurate determination of the detector response function, the polarization sensitivity has been addressed in this study. For this purpose photon beams at energies of 60 keV and 210 keV have been...
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In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2007, vol. 260, no. 2, p. 642-646
In this work our previous study about chemical effects in the Kα spectra of S compounds employing high-resolution X-ray spectroscopy has been extended to the Kβ emission spectra. The measurements were performed with a wavelength dispersive single crystal spectrometer operated in the von Hamos geometry having an energy resolution comparable to the natural linewidth of the measured Kβ X-ray...
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In: Physical Review A, 2007, vol. 75, no. 2, p. 022512
X-ray resonant Raman scattering (RRS) spectra of Al, Al₂O₃, Si, and SiO₂ were measured at the European Synchrotron Radiation Facility, using a high-resolution Bragg-type curved crystal spectrometer. The x-ray RRS spectra were collected at several beam energies tuned below the 1s absorption thresholds of Al and Si. Differences in the spectral features between the elemental samples and...
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In: Brazilian Journal of Physics, 2006, vol. 36, no. 2B, p. 546-549
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In: Physical Review Letters, 2006, vol. 97, p. 073001
We report on the first high-resolution measurements of the K x-ray resonant Raman scattering (RRS) in Si. The measured x-ray RRS spectra, interpreted using the Kramers-Heisenberg approach, revealed spectral features corresponding to electronic excitations to the conduction and valence bands in silicon. The total cross sections for the x-ray RRS at the 1s absorption edge and the ...
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In: Nuclear Instruments and Methods in Physics Research B: Beam Interactions with Materials and Atoms, 2005, vol. 238, p. 353
High-resolution measurements of the resonant X-ray Raman scattering (RRS) of Al and Si and their oxides were performed at the European Synchrotron Radiation Facility (ESRF) in Grenoble, France, using a von Hamos Bragg-type curved crystal spectrometer. To probe the influence of chemical effects on the RRS X-ray spectra, Al₂O₃ and SiO₂ samples were also investigated. The X-ray RRS spectra...
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In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2005, vol. 235 (1-4), p. 110-115
K-X-ray spectra of Zr, Nb, Mo and Pd targets bombarded with 250 MeV carbon and 360 MeV oxygen ions are studied with high resolution diffraction spectrometry. Relative yields and natural widths of the Khα1,2 hypersatellite lines are determined and compared with those of the diagram lines. The widths of Khα1,2 lines are compared with the new ...
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In: Nuclear Instruments and Methods in Physics Research B: Beam Interactions with Materials and Atoms, 2005, vol. 233(1-4), p. 235-239
The double 1s ionization of Si induced in collisions with protons and heavier ions (C, Ne) was studied by measuring the K X-ray emission of a solid Si target. In order to resolve the hypersatellite contributions in the spectra, high-resolution crystal diffractometry was employed yielding subelectronvolt energy resolution. Experimentally obtained hypersatellite yields were used to determine the...
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In: Physical Review A, 2004, vol. 70, p. 062720-62730
The satellite and hypersatellite K x-ray emission of a thin Mg foil and thick polycrystalline Si target bombarded by 34-MeV C and 50-MeV Ne ions was measured using high-resolution crystal diffractometry. The corresponding projectile reduced velocities v/vK were 1.09 and 0.92 for C ions and 1.02, 0.86 for Ne ions in case of Mg and Si targets, respectively. An energy resolution of approximately 0.5...
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In: Journal of Electron Spectroscopy and Related Phenomena, 2004, vol. 137-140, p. 687-690
The high-resolution von Hamos Bragg crystal spectrometer was constructed for the study of K X-ray emission from low-Z elements and L and M X-ray spectra of medium to high Z elements. Recently, this instrument was applied to high-resolution XES and RIXS studies using X-ray synchrotron radiation at the ID21 and BM5 beamlines at the ESRF. An outline of the spectrometer design and performance...
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