Résultats de la recherche

A DuMond-type crystal spectrometer for synchrotron-based X-ray emission studies in the energy range of 15–26 keV

Jagodziński, Paweł ; Szlachetko, Jakub ; Dousse, Jean-Claude ; Hoszowska, Joanna ; Szlachetko, Monika ; Vogelsang, U. ; Banaś, Dariusz ; Pakendorf, T. ; Meents, A. ; Bokhoven, Jeroen A. van ; Kubala-Kukuś, Aldona ; Pajek, Marek ; Nachtegaal, Maarten

In: Review of Scientific Instruments, 2019, vol. 90, no. 6, p. 063106

The design and performance of a high-resolution transmission-type X-ray spectrometer for use in the 15–26 keV energy range at synchrotron light sources is reported. Monte Carlo X-ray-tracing simulations were performed to optimize the performance of the transmission-type spectrometer, based on the DuMond geometry, for use at the Super X-ray absorption beamline of the Swiss Light Source at...

OPEN IN
SONAR

Depth profiling of low energy ion implantations in Si and Ge by means of micro-focused grazing emission X-ray fluorescence and grazing incidence X-ray fluorescence

Kayser, Yves ; Hönicke, Philipp ; Banaś, Dariusz ; Dousse, Jean-Claude ; Hoszowska, Joanna ; Jagodziński, Paweł ; Kubala-Kukuś, Aldona ; Nowak, Stanisław H. ; Pajek, Marek

In: Journal of Analytical Atomic Spectrometry, 2015, p. -

Depth-profiling measurements by means of synchrotron radiation based grazing XRF techniques, i.e., grazing emission X-ray fluorescence (GEXRF) and grazing incidence X-ray fluorescence (GIXRF), present a promising approach for the non-destructive, sub-nanometer scale precision characterization of ultra shallow ion-implantations. The nanometer resolution is of importance with respect to actual...

Affiner les résultats

Type de document

Institution

Collection spécifique

Langue

Auteur