Université de Neuchâtel

Electronic transport in hydrogenated microcrystalline silicon: similarities with amorphous silicon

Droz, Corinne ; Goerlitzer, M. ; Wyrsch, Nicolas ; Shah, Arvind

In: Journal of Non-Crystalline Solids, 2000, vol. 266-269, p. 319-324

Undoped hydrogenated microcrystalline silicon (μc-Si:H) layers were grown by the very high frequency glow discharge (VHF-GD) technique under various deposition conditions. The electronic transport properties under illumination were investigated by means of steady-state photoconductivity and steady-state photocarrier grating methods. Similarly to hydrogenated amorphous silicon (a-Si:H), power law...

Université de Neuchâtel

Hydrogenated microcrystalline silicon: how to correlate layer properties and solar cell performance

Wyrsch, Nicolas ; Feitknecht, Luc ; Droz, Corinne ; Torres, Pedro ; Shah, Arvind ; Poruba, A. ; Vaněček, Milan

In: Journal of Non-Crystalline Solids, 2000, vol. 266-269, p. 1099-1103

Undoped hydrogenated microcrystalline silicon (μc-Si:H) layers and cells have been deposited by plasma chemical vapour deposition at low temperature at different powers and silane dilutions. Electronic transport properties and defect density of the layers have been compared to the cell performances to identify the important material properties for solar cell applications. A correlation is found...

Université de Neuchâtel

Influence of substrate on the microstructure of microcrystalline silicon layers and cells

Bailat, Julien ; Vallat-Sauvain, Evelyne ; Feitknecht, Luc ; Droz, Corinne ; Shah, Arvind

In: Journal of Non-Crystalline Solids, 2002, vol. 299-302, p. 1219-1223

Hydrogenated microcrystalline silicon i-layers were deposited with a fixed silane concentration on various substrates and incorporated into n–i–p solar cells. ‘Average crystallinity' and detailed microstructure of layers and devices were evaluated by X-ray diffraction (XRD) and transmission electron microscopy (TEM), respectively. The role of the substrate is thereby shown to be very...

Université de Neuchâtel

Effect of the microstructure on the electronic transport in hydrogenated microcrystalline silicon

Wyrsch, Nicolas ; Droz, Corinne ; Feitknecht, Luc ; Torres, Pedro ; Vallat-Sauvain, Evelyne ; Ballif, Christophe ; Shah, Arvind

In: Journal of Non-Crystalline Solids, 2002, vol. 299-302, p. 390-394

Undoped hydrogenated amorphous silicon layers deposited at different values of very high frequency (VHF) powers and silane to hydrogen dilution ratios possess various types of microstructures. Transport and defect measurements on layers suggest that structural properties (e.g., crystallite shape and size) do not significantly affect electronic properties. The latter depend mostly on defect...

Université de Neuchâtel

Basic efficiency limits, recent experimental results and novel light-trapping schemes in a-Si:H, μc-Si:H and ‘micromorph tandem' solar cells

Shah, Arvind ; Vaněček, Milan ; Meier, Johannes ; Meillaud, Fanny ; Guillet, Joelle ; Fischer, Diego ; Droz, Corinne ; Niquille, Xavier ; Faÿ, Sylvie ; Vallat-Sauvain, Evelyne ; Terrazzoni-Daudrix, Vanessa ; Bailat, Julien

In: Journal of Non-Crystalline Solids, 2004, vol. 338-340, p. 639-645

Theoretical: Limits for Jsc, Voc, FF and efficiency of single-junction solar cells and tandems are derived, as a function of Eg, showing that: (1) double-junction ‘micromorph' solar cells constitute an optimum combination of bandgap values; (2) main future gain for thin-film silicon solar cells will be increasing...

Université de Neuchâtel

Thin film microcrystalline silicon layers and solar cells : microstructure and electrical performances

Droz, Corinne ; Shah, Arvind (Dir.)

Thèse de doctorat : Université de Neuchâtel : 2003 ; 1757.

Le silicium microcristallin hydrogéné (mc?Si:H), tel que fabriqué par la technique de dépôt chimique en phase vapeur assisté par plasma à très haute fréquence (VHF PE-CVD), est maintenant utilisé avec succès en tant que couche active dans des cellules solaires. Cependant, une question fondamentale concerne le lien entre la microstructure du matériau, d'une part, et les propriétés de...