Université de Fribourg

Hypersatellite x-ray decay of $3d$ hollow-$K$-shell atoms produced by heavy-ion impact

Maillard, Yves-Patrick ; Dousse, Jean-Claude ; Hoszowska, Joanna ; Berset, Michel ; Mauron, Olivier ; Raboud, Pierre-Alexandre ; Kavčič, Matjaz ; Rzadkiewicz, J. ; Banaś, Dariusz ; Tökési, K.

In: Physical Review A, 2018, vol. 98, no. 1, p. 012705

We report on the radiative decay of double K-shell vacancy states produced in solid Ca, V, Fe, and Cu targets by impact with about 10 MeV/amu C and Ne ions. The resulting K hypersatellite x-ray emission spectra were measured by means of high- energy-resolution spectroscopy using a von Hamos bent crystal spectrometer. The experiment was carried out at the Philips variable energy cyclotron of...

Université de Fribourg

Depth profiling of low energy ion implantations in Si and Ge by means of micro-focused grazing emission X-ray fluorescence and grazing incidence X-ray fluorescence

Kayser, Yves ; Hönicke, Philipp ; Banaś, Dariusz ; Dousse, Jean-Claude ; Hoszowska, Joanna ; Jagodziński, Paweł ; Kubala-Kukuś, Aldona ; Nowak, Stanisław H. ; Pajek, Marek

In: Journal of Analytical Atomic Spectrometry, 2015, p. -

Depth-profiling measurements by means of synchrotron radiation based grazing XRF techniques, i.e., grazing emission X-ray fluorescence (GEXRF) and grazing incidence X-ray fluorescence (GIXRF), present a promising approach for the non-destructive, sub-nanometer scale precision characterization of ultra shallow ion-implantations. The nanometer resolution is of importance with respect to actual...