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Université de Fribourg

Establishing nonlinearity thresholds with ultraintense X-ray pulses

Szlachetko, Jakub ; Hoszowska, Joanna ; Dousse, Jean-Claude ; Nachtegaal, Maarten ; Błachucki, Wojciech ; Kayser, Yves ; Sà, Jacinto ; Messerschmidt, Marc ; Boutet, Sebastien ; Williams, Garth J. ; David, Christian ; Smolentsev, Grigory ; Bokhoven, Jeroen A. van ; Patterson, Bruce D. ; Penfold, Thomas J. ; Knopp, Gregor ; Pajek, Marek ; Abela, Rafael ; Milne, Christopher J.

In: Scientific Reports, 2016, vol. 6, p. 33292

X-ray techniques have evolved over decades to become highly refined tools for a broad range of investigations. Importantly, these approaches rely on X-ray measurements that depend linearly on the number of incident X-ray photons. The advent of X-ray free electron lasers (XFELs) is opening the ability to reach extremely high photon numbers within ultrashort X-ray pulse durations and is leading...

Université de Fribourg

The electronic structure of matter probed with a single femtosecond hard x-ray pulse

Szlachetko, Jakub ; Milne, a), C. J. ; Hoszowska, Joanna ; Dousse, Jean-Claude ; Błachucki, W. ; Sà, J. ; Kayser, Yves ; Messerschmidt, M. ; Abela, R. ; Boutet, S. ; David, Christian ; Williams, G. ; Pajek, M. ; Patterson, B. D. ; Smolentsev, G. ; Bokhoven, J. A. van ; Nachtegaal, M.

In: Structural Dynamics, 2014, vol. 1, no. 2, p. 021101

Physical, biological, and chemical transformations are initiated by changes in the electronic configuration of the species involved. These electronic changes occur on the timescales of attoseconds (10−18 s) to femtoseconds (10−15 s) and drive all subsequent electronic reorganization as the system moves to a new equilibrium or quasi-equilibrium state. The ability to detect the dynamics of...

Université de Fribourg

A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies

Szlachetko, Jakoub ; Nachtegaal, M. ; Boni, E. de ; Willimann, M. ; Safonova, O. ; Sa, J. ; Smolentsev, G. ; Szlachetko, Monika ; Bokhoven, J. A. van ; Dousse, Jean-Claude ; Hoszowska, J. ; Kayser, Yves ; Jagodziński, P. ; Bergamaschi, A. ; Schmitt, Bernd ; David, Christian ; Lücke, A.

In: Review of Scientific Instruments, 2012, vol. 83, no. 10, p. 103105

We report on the design and performance of a wavelength-dispersive type spectrometer based on the von Hamos geometry. The spectrometer is equipped with a segmented-type crystal for x-ray diffraction and provides an energy resolution in the order of 0.25 eV and 1 eV over an energy range of 8000 eV–9600 eV. The use of a segmented crystal results in a simple and straightforward crystal preparation...