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Contact damage of hard and brittle thin films on ductile metallic substrates: an analysis of diamond-like carbon on titanium substrates

Bernoulli, D. ; Wyss, A. ; Raghavan, R. ; Thorwarth, K. ; Hauert, R. ; Spolenak, R.

In: Journal of Materials Science, 2015, vol. 50, no. 7, p. 2779-2787

Comparison of In Situ Micromechanical Strain-Rate Sensitivity Measurement Techniques

Wehrs, Juri ; Mohanty, Gaurav ; Guillonneau, Gaylord ; Taylor, Aidan ; Maeder, Xavier ; Frey, Damian ; Philippe, Laetitia ; Mischler, Stefano ; Wheeler, Jeffrey ; Michler, Johann

In: JOM, 2015, vol. 67, no. 8, p. 1684-1693

Isogeometric rotation-free analysis of planar extensible-elastica for static and dynamic applications

Maurin, Florian ; Dedè, Luca ; Spadoni, Alessandro

In: Nonlinear Dynamics, 2015, vol. 81, no. 1-2, p. 77-96

Elevated Temperature, In Situ Micromechanical Characterization of a High Temperature Ternary Shape Memory Alloy

Wheeler, J. ; Niederberger, C. ; Raghavan, R. ; Thompson, G. ; Weaver, M. ; Michler, J.

In: JOM, 2015, vol. 67, no. 12, p. 2908-2913

Transition from light diffusion to localization in three-dimensional amorphous dielectric networks near the band edge

Haberko, Jakub ; Froufe-Pérez, Luis S. ; Scheffold, Frank

In: Nature Communications, 2020, vol. 11, no. 1, p. 4867

AbstractLocalization of light is the photon analog of electron localization in disordered lattices, for whose discovery Anderson received the Nobel prize in 1977. The question about its existence in open three-dimensional materials has eluded an experimental and full theoretical verification for decades. Here we study numerically electromagnetic vector wave transmittance through realistic...

Lateral resolution in focused electron beam-induced deposition: scaling laws for pulsed and static exposure

Szkudlarek, Aleksandra ; Szmyt, Wojciech ; Kapusta, Czesław ; Utke, Ivo

In: Applied Physics A, 2014, vol. 117, no. 4, p. 1715-1726

Timing of retreat of the Reuss Glacier (Switzerland) at the end of the Last Glacial Maximum

Reber, Regina ; Akçar, Naki ; Ivy-Ochs, Susan ; Tikhomirov, Dmitry ; Burkhalter, Reto ; Zahno, Conradin ; Lüthold, Aron ; Kubik, Peter ; Vockenhuber, Christof ; Schlüchter, Christian

In: Swiss Journal of Geosciences, 2014, vol. 107, no. 2-3, p. 293-307

In Situ Treatment of Thermal RF Plasma Processed Nanopowders to Control their Agglomeration and Dispersability

Leparoux, M. ; Leconte, Y. ; Wirth, A. ; Buehler, Th

In: Plasma Chemistry and Plasma Processing, 2010, vol. 30, no. 6, p. 779-793

Detection of negative ions in glow discharge mass spectrometry for analysis of solid specimens

Canulescu, Stela ; Molchan, Igor ; Tauziede, C. ; Tempez, Agnes ; Whitby, J. ; Thompson, George ; Skeldon, Peter ; Chapon, P. ; Michler, Johann

In: Analytical and Bioanalytical Chemistry, 2010, vol. 396, no. 8, p. 2871-2879

Poly-si extensions and etching residues as a reliability risk

Jacob, Peter

In: Microsystem Technologies, 2009, vol. 15, no. 1, p. 169-174