Université de Neuchâtel

Optimized scattering compensation for time-of-flight camera

Mure-Dubois, James ; Hügli, Heinz

In: Two- and Three-Dimensional Methods for Inspection and Metrology V (Proceedings of SPIE), 2007, vol. 6762, no. 67620H, p. 1-10

Recent time-of-flight (TOF) cameras allow for real-time acquisition of range maps with good performance. However, the accuracy of the measured range map may be limited by secondary light reflections. Specifically, the range measurement is affected by scattering, which consists in parasitic signals caused by multiple reflections inside the camera device. Scattering, which is particularly strong in...

Université de Neuchâtel

Embedded 3D vision system for automated micro-assembly

Mure-Dubois, James ; Hügli, Heinz

In: Two- and Three-Dimensional Methods for Inspection and Metrology IV (Proceedings of SPIE), 2008, vol. 6382, no. 63820J, p. 1-11

Machine vision plays an important role in automated assembly. However, present vision systems are not adequate for robot control in an assembly environment where individual components have sizes in the range of 1 to 100 micrometers, since current systems do not provide sufficient resolution in the whole workspace when they are fixed, and they are too bulky to be brought close enough to the...