Université de Fribourg

Double K-shell photoionization and hypersatellite x-ray transitions of 12⩽Z⩽23 atoms

Hoszowska, Joanna ; Dousse, Jean-Claude ; Cao, Wei ; Fennane, Karima ; Kayser, Yves ; Szlachetko, Monika ; Szlachetko, Jakub ; Kavčič, Matjaz

In: Physical Review A, 2010, vol. 82, no. 6, p. 063408

Single-photon double K-shell ionization of low-Z neutral atoms in the range 12⩽Z⩽23 is investigated. The experimental method was based on measurements of the high- resolution Kαh hypersatellite x-ray spectra following the radiative decay of the K-shell double-vacancy states excited by monochromatic synchrotron radiation. The photon energy dependence of the double K-shell ionization was...

Université de Fribourg

Reexamination of M2,3 atomic level widths and L1M2,3 transition energies of elements 69≤Z≤95

Fennane, Karima ; Berset, Michel ; Dousse, Jean-Claude ; Hoszowska, Joanna ; Raboud, Pierre-Alexandre ; Campbell, J.L..

In: Physical Review A, 2014, vol. 88, no. 5, p. 052506

We report on high-resolution measurements of the photoinduced L1M2 and L1M3 x-ray emission lines of 69Tm, 70Yb, 71Lu, 73Ta, 74W, 75Re, 77Ir, 81Tl, 83Bi, and 95Am. From the linewidths of the measured transitions an accurate set of M2 and M3 level widths is determined assuming for the L1 level widths the values reported by Raboud [P.-A. Raboud et al., Phys. Rev. A 65, 022512 (2002)]. Furthermore,...

Université de Fribourg

High-resolution KMM radiative Auger x-ray emission spectra of calcium induced by synchrotron radiation

Cao, Wei ; Kavčič, Matjaz ; Dousse, Jean-Claude ; Berset, Michel ; Bučar, K. ; Budnar, M. ; Fennane, Karima ; Hoszowska, Joanna ; Maillard, Yves-Patrick ; Szlachetko, Jakub ; Szlachetko, Monika ; Žitnik, M.

In: Physical Review A, 2011, vol. 83, no. 4, p. 042513

The KMM radiative Auger (RA) x-ray spectra of solid Ca were induced by monochromatic synchrotron radiation and measured with a high-resolution von Hamos bent crystal spectrometer. Two excitation energies were employed, one in the near K threshold region and the second well above the K absorption edge. The KMM RA spectral structure and relative intensity with respect to the diagram ...

Université de Fribourg

Single-photon double K-shell ionization of low-Z atoms

Hoszowska, Joanna ; Kheifets, A. S. ; Dousse, Jean-Claude ; Bray, Igor ; Cao, Wei ; Fennane, Karima ; Kayser, Yves ; Kavčič, Matjaz ; Szlachetko, Jakub ; Szlachetko, Monika

In: Journal of Physics: Conference Series, 2010, vol. 212, no. 1, p. 012006

The photon energy dependence of the double K-shell ionization of light atoms is reported. Experimental double-to-single photoionization cross section ratios for Mg, Al, Si and Ca were obtained from measurements of high-resolution x-ray emission spectra. The double photoionization (DPI) cross-sections for K-shell hollow atom production are compared to convergent close-coupling calculations (CCC)...

Université de Fribourg

Double K-shell photoionization of low-Z atoms and He-like ions

Hoszowska, Joanna ; Kheifets, A. S. ; Berset, Michel ; Bray, I. ; Cao, Wei ; Dousse, Jean-Claude ; Fennane, Karima ; Kavčič, M. ; Kayser, Yves ; Szlachetko, Jakub ; Szlachetko, Monika

In: The European Physical Journal: Special Topics, 2009, vol. 169, no. 1, p. 23-27

We report on the investigation of the photon energy dependence of double 1s photoionization of light atoms and compare the cross sections for hollow atom and He-like ion production. Measurements of the Kα hypersatellite x-ray spectra of Mg, Al, and Si were carried out using the Fribourg high-resolution x-ray spectrometer installed at the ID21 and ID26 beam lines at the ESRF. The...

Université de Fribourg

Double K-shell ionization of Al induced by photon and electron impact

Fennane, Karima ; Dousse, Jean-Claude ; Hoszowska, Joanna ; Berset, Michel ; Cao, Wei ; Maillard, Yves-Patrick ; Szlachetko, Jakub ; Szlachetko, Monika ; Kavčič, M.

In: Physical Review A, 2009, vol. 79, no. 3, p. 032708

This paper reports on the investigation of the double K-shell ionization of metallic aluminum induced by photon and electron impact. The experimental method consisted to measure the Kα hypersatellite spectra resulting from the radiative decay of double 1s vacancy states by means of high-resolution x-ray spectroscopy using a Bragg-type von Hamos crystal spectrometer....

Université de Fribourg

Physical mechanisms and scaling laws of K-shell double photoionization

Hoszowska, Joanna ; Kheifets, A. K. ; Dousse, Jean-Claude ; Berset, Michel ; Bray, I. ; Cao, Wei ; Fennane, Karima ; Kayser, Yves ; Kavčič, Matjaz ; Szlachetko, Jakub ; Szlachetko, Monika

In: Physical Review Letters, 2009, vol. 102, no. 7, p. 073006

We report on the photon energy dependence of the K-shell double photoionization (DPI) of Mg, Al, and Si. The DPI cross sections were derived from high-resolution measurements of x-ray spectra following the radiative decay of the K-shell double vacancy states. Our data evince the relative importance of the final-state electron- electron interaction to the DPI. By comparing the double-to-single...

Université de Fribourg

High-resolution study of the x-ray resonant Raman scattering process around the 1s absorption edge for aluminium, silicon, and their oxides

Szlachetko, Jakub ; Dousse, Jean-Claude ; Berset, Michel ; Fennane, Karima ; Szlachetko, Monika ; Hoszowska, Joanna ; Barrett, R. ; Pajek, M. ; Kubala-Kukus, A.

In: Physical Review A, 2007, vol. 75, no. 2, p. 022512

X-ray resonant Raman scattering (RRS) spectra of Al, Al₂O₃, Si, and SiO₂ were measured at the European Synchrotron Radiation Facility, using a high-resolution Bragg-type curved crystal spectrometer. The x-ray RRS spectra were collected at several beam energies tuned below the 1s absorption thresholds of Al and Si. Differences in the spectral features between the elemental samples and...

Université de Fribourg

High-resolution study of x-ray resonant Raman scattering at the k edge of silicon

Szlachetko, Jakub ; Dousse, Jean-Claude ; Hoszowska, Joanna ; Pajek, M. ; Barrett, R. ; Berset, Michel ; Fennane, Karima ; Kubala-Kukus, A. ; Szlachetko, Monika

In: Physical Review Letters, 2006, vol. 97, p. 073001

We report on the first high-resolution measurements of the K x-ray resonant Raman scattering (RRS) in Si. The measured x-ray RRS spectra, interpreted using the Kramers-Heisenberg approach, revealed spectral features corresponding to electronic excitations to the conduction and valence bands in silicon. The total cross sections for the x-ray RRS at the 1s absorption edge and the ...