In: Review of Scientific Instruments, 2012, vol. 83, no. 10, p. 103105
We report on the design and performance of a wavelength-dispersive type spectrometer based on the von Hamos geometry. The spectrometer is equipped with a segmented-type crystal for x-ray diffraction and provides an energy resolution in the order of 0.25 eV and 1 eV over an energy range of 8000 eV–9600 eV. The use of a segmented crystal results in a simple and straightforward crystal...
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In: X-Ray Spectrometry, 2012, vol. 41, no. 2, p. 98-104
We report on the surface-sensitive grazing emission X-ray fluorescence technique combined with synchrotron radiation excitation and high-resolution detection to realize depth-profile measurements of Al-implanted Si wafers. The principles of grazing emission measurements as well as the benefits offered by synchrotron sources and wavelength-dispersive detection setups are presented. It is shown...
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In: Physical Review Letters, 2011, vol. 107, no. 5, p. 053001
xperimental evidence for the correlated two-electron one-photon transitions (1s⁻²→2s⁻¹2p⁻¹) following single-photon K-shell double ionization is reported. The double K-shell vacancy states in solid Mg, Al, and Si were produced by means of monochromatized synchrotron radiation, and the two-electron one-photon radiative transitions were observed by using a wavelength dispersive...
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In: Spectrochimica Acta Part B: Atomic Spectroscopy, 2010, p. -
The synchrotron radiation based high-resolution grazing emission X-ray fluorescence (GEXRF) technique was used to extract the distribution of Al ions implanted with a dose of 10¹⁶ atoms/cm² in Si wafers with energies ranging between 1 and 100 keV. The depth distributions of the implanted ions were deduced from the measured angular profiles of the Al-Kα X-ray fluorescence line with...
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