Université de Neuchâtel

Measurement of the Bending Strength of Vapor−Liquid−Solid Grown Silicon Nanowires

Hoffmann, Samuel ; Utke, Ivo ; Moser, Benedikt ; Michler, Johann ; Christiansen, Silke H. ; Schmidt, Volker ; Senz, Stephan ; Werner, Peter ; Gösele, Ulrich ; Ballif, Christophe

In: Nano Letters, 2006, vol. 6, no. 4, p. 622–625

The fracture strength of silicon nanowires grown on a [111] silicon substrate by the vapor−liquid−solid process was measured. The nanowires, with diameters between 100 and 200 nm and a typical length of 2 μm, were subjected to bending tests using an atomic force microscopy setup inside a scanning electron microscope. The average strength calculated from the maximum nanowire deflection before...

Université de Neuchâtel

Electrical and mechanical charaterization of silicon and zinc oxide nanowires

Hoffmann, Samuel ; Ballif, Christophe (Dir.)

Thèse de doctorat : Université de Neuchâtel, 2008 ; Th. 2067.

Semiconducting nanowires can be grown epitaxially on crystalline substrates in predefined directions. This bottom up approach stands in contrast to the common top down technology in semiconductor industry. With diameters down to a few nanometers, the nanowires’ small dimensions open up new possibilities for sensors and electronic devices. This thesis deals with the electrical,...