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Wavelength-dispersive spectrometer for X-ray microfluorescence analysis at the X-ray microscopy beamline ID21 (ESRF)

Szlachetko, Jakub ; Cotte, M. ; Morse, J. ; Salomé, M. ; Jagodzinski, P. ; Dousse, Jean-Claude ; Hoszowska, Joanna ; Kayser, Yves ; Susini, J.

In: Journal of Synchrotron Radiation, 2010, vol. 17, no. 3, p. 400-408

The development of a wavelength-dispersive spectrometer for microfluorescence analysis at the X-ray Microscopy ID21 beamline of the European Synchrotron Radiation Facility (ESRF) is reported. The spectrometer is based on a polycapillary optic for X-ray fluorescence collection and is operated in a flat-crystal geometry. The design considerations as well as operation characteristics of the...