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Université de Neuchâtel

Optimized scattering compensation for time-of-flight camera

Mure-Dubois, James ; Hügli, Heinz

In: Two- and Three-Dimensional Methods for Inspection and Metrology V (Proceedings of SPIE), 2007, vol. 6762, no. 67620H, p. 1-10

Recent time-of-flight (TOF) cameras allow for real-time acquisition of range maps with good performance. However, the accuracy of the measured range map may be limited by secondary light reflections. Specifically, the range measurement is affected by scattering, which consists in parasitic signals caused by multiple reflections inside the camera device. Scattering, which is particularly strong in...