Université de Neuchâtel

Measurement of the Bending Strength of Vapor−Liquid−Solid Grown Silicon Nanowires

Hoffmann, Samuel ; Utke, Ivo ; Moser, Benedikt ; Michler, Johann ; Christiansen, Silke H. ; Schmidt, Volker ; Senz, Stephan ; Werner, Peter ; Gösele, Ulrich ; Ballif, Christophe

In: Nano Letters, 2006, vol. 6, no. 4, p. 622–625

The fracture strength of silicon nanowires grown on a [111] silicon substrate by the vapor−liquid−solid process was measured. The nanowires, with diameters between 100 and 200 nm and a typical length of 2 μm, were subjected to bending tests using an atomic force microscopy setup inside a scanning electron microscope. The average strength calculated from the maximum nanowire deflection before...