Université de Neuchâtel

High Resolution Interference Microscopy: A Tool for Probing Optical Waves in the Far-Field on a Nanometric Length Scale

Rockstuhl, Carsten ; Märki, Iwan ; Scharf, Toralf ; Salt, Martin Guy ; Herzig, Hans-Peter ; Dändliker, René

In: Current Nanoscience, 2006, vol. 2, no. 4, p. 337-350

High Resolution Interference Microscopy (HRIM) is a technique that allows the characterization of amplitude and phase of electromagnetic wave-fields in the far-field with a spatial accuracy that corresponds to a few nanometers in the object plane. Emphasis is put on the precise determination of topological features in the wave-field, called phase singularities or vortices, which are spatial...

Université de Neuchâtel

Confocal microscopy using variable-focal-length microlenses and an optical fiber bundle

Yang, Lisong ; Mac Raighne, Aaron ; McCabe, Eithne M. ; Dunbar, L. Andrea ; Scharf, Toralf

In: Applied Optics, 2005, vol. 44, no. 28, p. 5928-5936

The use of variable-focal-length (VFL) microlenses can provide a way to axially scan the foci across a sample by electronic control. We demonstrate an approach to coupling VFL microlenses individually to a fiber bundle as a way to create a high-throughput aperture array with a controllable aperture pattern. It would potentially be applied in real-time confocal imaging in vivo for biological...

Université de Neuchâtel

On the chromatic aberration of microlenses

Ruffieux, Patrick ; Scharf, Toralf ; Herzig, Hans-Peter ; Völkel, Reinhard ; Weible, Kenneth J.

In: Optics Express, 2006, vol. 14, no. 11, p. 4687-4694

The optical properties of plano-convex refractive microlenses with low Fresnel Number (typically FN < 10) are investigated. It turns out that diffraction effects at the lens aperture limit the range of the effective focal length. The upper limit of the focal length is determined by the diffraction pattern of a pinhole with equal diameter. In addition achromatic microlenses can be realized because...

Université de Neuchâtel

Microstructured Optics: Moving toward the nanoscale (Japanese Version)

Herzig, Hans-Peter ; Märki, Iwan ; Scharf, Toralf ; Nakagawa, Wataru

In: Laser Focus World Japan, 2007, vol. 1, p. 1-3

From diffractive optics at the microscale to plasmonics at the nanoscale, optical devices relying onmicrostructures have unique and valuable properties.

Université de Neuchâtel

Microstructured Optics: Moving toward the nanoscale

Herzig, Hans-Peter ; Märki, Iwan ; Scharf, Toralf ; Nakagawa, Wataru

In: Laser Focus World, 2007, vol. 1, p. 1-5

From diffractive optics at the microscale to plasmonics at the nanoscale, optical devices relying onmicrostructures have unique and valuable properties.