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Université de Neuchâtel

Performance of an Integrated Microoptical System for Fluorescence Detection in Microfluidic Systems

Roulet , Jean-Christophe ; Völkel, Reinhard ; Herzig, Hans Peter ; Verpoorte, Elisabeth ; de Rooij, Nicolaas F. ; Dändliker, René

In: Analytical Chemistry, 2020, vol. 74, no. 14, p. 3400-3407

This article presents a new integrated microfluidic/microoptic device designed for basic biochemical analysis. The microfluidic network is wet-etched in a Borofloat 33 (Pyrex) glass wafer and sealed by means of a second wafer. Unlike other similar microfluidic systems, elements of the detection system are realized with the help of microfabrication techniques and directly deposited on both sides...

Université de Neuchâtel

High Resolution Interference Microscopy: A Tool for Probing Optical Waves in the Far-Field on a Nanometric Length Scale

Rockstuhl, Carsten ; Märki, Iwan ; Scharf, Toralf ; Salt, Martin Guy ; Herzig, Hans-Peter ; Dändliker, René

In: Current Nanoscience, 2006, vol. 2, no. 4, p. 337-350

High Resolution Interference Microscopy (HRIM) is a technique that allows the characterization of amplitude and phase of electromagnetic wave-fields in the far-field with a spatial accuracy that corresponds to a few nanometers in the object plane. Emphasis is put on the precise determination of topological features in the wave-field, called phase singularities or vortices, which are spatial...

Université de Neuchâtel

Monolithically integrated optical displacement sensor in GaAs/AlGaAs

Hofstetter, Daniel ; Zappe, H. P. ; Dändliker, René

In: Electronics Letters, 1995, vol. 31, no. 24, p. 2121-2122

A monolithically integrated displacement sensor has been fabricated in the GaAs/AlGaAs material system. The device is configured as a Michelson interferometer and consists of a DBR laser, a directional coupler, transparent waveguides and a photodetector. Interference fringes could be seen at a measurement distance of up to 45 cm, requiring only the alignment of an external GRIN lens for beam...

Université de Neuchâtel

Optical displacement measurement with GaAs/AlGaAs-based monolithically integrated Michelson interferometers

Hofstetter, Daniel ; Zappe, H. P. ; Dändliker, René

In: Journal of Lightwave Technology, 1997, vol. 15, no. 4, p. 663-670

Two monolithically integrated optical displacement sensors fabricated in the GaAs/AlGaAs material system are reported. These single-chip microsystems are configured as Michelson interferometers and comprise a distributed Bragg reflector (DBR) laser, photodetectors, phase shifters, and waveguide couplers. While the use of a single Michelson interferometer allows measurement of displacement...

Université de Neuchâtel

A monolithically integrated double Michelson interferometer for optical displacement measurement with direction determination

Hofstetter, Daniel ; Zappe, H. P. ; Dändliker, René

In: Photonics Technology Letters (IEEE), 1996, vol. 8, no. 10, p. 1370-1372

A monolithically integrated optical displacement sensor fabricated in the GaAs-AlGaAs material system is reported. The single-chip device consists of a distributed Bragg reflector laser, two photodetectors, two phase modulators, two Y-couplers, and two directional couplers. It is configured as a double Michelson interferometer and allows the determination of both magnitude and direction of a...

Université de Neuchâtel

Design and Fabrication of Highly Efficient Fan-Out Elements

Herzig, Hans-Peter ; Prongué, Damien ; Dändliker, René

In: Japanese Journal of Applied Physics, 1990, vol. 29, no. 7, p. 1307-1309

This paper reports the calculation and fabrication of periodic phase structures fan-out elements with a theoretical conversion efficiency close to 100 percent and perfect uniformity. An efficiency of 92 percent was measured for a smooth kinoform structure fabricated in photoresist by laser beam writing lithography.