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Université de Neuchâtel

Measuring amplitude and phase distribution of fields generated by gratings with sub-wavelength resolution

Nesci, A. ; Dändliker, René ; Salt, M. ; Herzig, Hans-Peter

In: Optics Communications, 2002, vol. 205, no. 4-6, p. 229-238

In this paper, we intend to gain an understanding of the interaction of light with microstructures. Measurements of amplitude and phase in the diffracted field close to gratings using a heterodyne scanning probe are presented. Coherent light diffracted by microstructures produces periodic features and can give birth to phase dislocations, also called phase singularities. Phase singularities are...

Université de Neuchâtel

From Holography To Micro-Optics

Herzig, Hans-Peter ; Ehbets, P.

In: Journal of Imaging Science and Technology (The), 1997, vol. 41, no. 5, p. 488-496

Holography can store wavefields in light-sensitive material. Due to its flexibility and the potential of multiplexing several functions into one element, holography has also been proposed as a recording technique for micro-optical elements. This paper discusses the recording of holograms that perform the basic functionalities (deflection, focusing, and fan-out) needed in micro-optical systems....

Université de Neuchâtel

Microstructured Optics: Moving toward the nanoscale

Herzig, Hans-Peter ; Märki, Iwan ; Scharf, Toralf ; Nakagawa, Wataru

In: Laser Focus World, 2007, vol. 1, p. 1-5

From diffractive optics at the microscale to plasmonics at the nanoscale, optical devices relying onmicrostructures have unique and valuable properties.

Université de Neuchâtel

Diffractive elements designed to suppress unwanted zeroth order due to surface depth error

Kettunen, Ville ; Jefimovs, Konstantins ; Simonen, Janne ; Ripoll, Olivier ; Kuittinen, Markku ; Herzig, Hans-Peter

In: Journal of Modern Optics, 2004, vol. 51, no. 14, p. 2111-2123

We consider a design approach to reduce unwanted zero-order intensity due to profile depth error in diffractive elements. Our method is based on addition of local bias phase to a binary element phase, leading to the introduction of a third phase level. We show theoretically and experimentally that gratings obtained with such modifications are more tolerant to profile depth error than...

Université de Neuchâtel

Low-data simulation of diffractive optical elements based on the zones geometry

Ripoll, Olivier ; Kettunen, Ville ; Herzig, Hans-Peter

In: Journal of Modern Optics, 2002, vol. 49, no. 11, p. 1801-1809

Design and simulation of two-dimensional diffractive optical elements are often limited by the amount of data required to represent the element in the computer's memory. We present a technique based on a geometrical description of the element, which requires fewer data than the traditional pixel description. Moreover, the element is being described more accurately and consequently the...

Université de Neuchâtel

Microlenses with annular amplitude and phase masks

Paeder, V. ; Scharf, T. ; Ruffieux, P. ; Herzig, Hans-Peter ; Voelkel, R. ; Weible, K.

In: Journal of the European Optical Society, 2007, vol. 07005, no. 2, p. 1-6

We present theoretical and experimental investigations of microlenses with both amplitude and phase masks. The light field in the focal region has been measured with a high resolution Mach-Zehnder interferometer with z-scan. The experimental results show good agreement with simulation. We show that we can obtain effects as diverse as squeezing or expansion in longitudinal and lateral directions,...

Université de Neuchâtel

Beam shaping in deep UV: comparison of methods

Kettunen, Ville ; Ripoll, Olivier ; Herzig, Hans-Peter

In: Diffractive Optics (Topical Meetings Digest Series), 2001, vol. 30, p. 80-81

Université de Neuchâtel

Low-data DOE simulation based on the zones geometry

Ripoll, Olivier ; Herzig, Hans-Peter ; Kettunen Ville

In: Diffractive Optics (Topical Meetings Digest Series), 2001, vol. 30, p. 78-79

Université de Neuchâtel

Infrared Gratings Based on SiC/Si-heterostructures

Rockstuhl, Carsten ; Herzig, Hans-Peter ; Förster, C. ; Leycuras, A. ; Ambacher, O. ; Pezoldt, J.

In: Materials Science Forum (MSF), 2005, vol. 483-485, p. 433-436

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