Perfeziona i miei risultati

Observation of ultralow-level Al impurities on a silicon surface by high-resolution grazing emission x-ray fluorescence excited by synchrotron radiation

Kubala-Kukus, A. ; Banas, D. ; Cao, Wei ; Dousse, Jean-Claude ; Hoszowska, Joanna ; Kayser, Yves ; Pajek, M. ; Salomé, M. ; Susini, J. ; Szlachetko, Jakub ; Szlachetko, Monika

In: Physical Review B, 2009, vol. 11, p. 113305

We demonstrate that ultralow-level Al impurities on a silicon surface can be measured by using the high-resolution grazing emission x-ray fluorescence (GEXRF) technique combined with synchrotron-radiation excitation. An Al-impurity level of about 10¹² atoms/cm² was reached by observing the Al Kα x-ray fluorescence in the resonant Raman-scattering background-“free” regime by...

Crystal optics for hard-X-ray spectroscopy of highly charged ions

Beyer, H.F. ; Attia, D. ; Banas, D. ; Bigot, E.-O. Le ; Bosch, F. ; Dousse, Jean-Claude ; Förster, E. ; Gumberidze, A. ; Hagmann, S. ; Heß, S. ; Hoszowska, Joanna ; Indelicato, P. ; Jagodzinski, P. ; Kozhuharov, Chr. ; Krings, Th. ; Liesen, D. ; Ma, X. ; Manil, B. ; Mohos, I. ; Pajek, M. ; Protić, D. ; Reuschl, R. ; Rzadkiewicz, J. ; Simionovici, A. ; Spillmann, U. ; Stachura, Z. ; Stöhlker, Th. ; Trassinelli, M. ; Trotsenko, S. ; Warczak, A. ; Wehrhan, O. ; Ziegler, E.

In: Spectrochimica Acta Part B: Atomic Spectroscopy, 2009, vol. 64, no. 8, p. 736-743

A twin crystal-spectrometer assembly, operated in the focusing compensated asymmetric Laue geometry has been developed for accurate spectroscopy of fast highly charged heavy ions in the hard-X-ray region. Coupled to the focusing crystal optics is a specially developed two-dimensional position-sensitive X-ray detector which is necessary for retaining spectral resolution also for fast moving...

Vacancy rearrangement processes in multiply ionized atoms

Czarnota, M. ; Pajek, M. ; Banas, D. ; Dousse, Jean-Claude ; Maillard, Yves-Patrick ; Mauron, Olivier ; Raboud, Pierre-Alexandre ; Berset, Michel ; Hoszowska, Joanna ; Slabkowska, K. ; Polasik, M. ; Chmielewska, D. ; Rzadkiewicz, J. ; Sujkowski, Z.

In: Journal of Physics: Conference Series, 2007, vol. 58, no. 1, p. 295

We demonstrate that in order to interpret the x-ray satellite structure of Pd Lα1,2(L₃M4,5) transitions excited by fast O ions, which was measured using a high-resolution von Hamos crystal spectrometer, the vacancy rearrangement processes, taking place prior to the x-ray emission, have to be taken into account. The measured spectra were compared with the predictions...

A 2D position sensitive germanium detector for spectroscopy and polarimetry of high-energetic x-rays

Stöhlker, Th. ; Spillmann, U. ; Banas, D. ; Beyer, H. F. ; Dousse, Jean-Claude ; Chatterjee, S. ; Hess, S. ; Kozhuharov, C. ; Kavčič, Matjaz ; Krings, T. ; Protic, D. ; Reuschl, R. ; Szlachetko, Jakub ; Tashenov, S. ; Trotsenko, S.

In: Journal of Physics: Conference Series, 2007, vol. 58, no. 1, p. 411-414

We report on a first prototype 2D μ-strip germanium detector, developed at IKP-Jülich, and its performance test at the European Synchrotron Radiation Facility (ESRF) in Grenoble, France. Beside an accurate determination of the detector response function, the polarization sensitivity has been addressed in this study. For this purpose photon beams at energies of 60 keV and 210 keV have been...

Multiple ionization effects in x-ray emission induced by heavy ions

Czarnota, M. ; Pajek, M. ; Banas, D. ; Dousse, Jean-Claude ; Maillard, Yves-Patrick ; Mauron, Olivier ; Raboud, Pierre-Alexandre ; Berset, Michel ; Chmielewska, D. ; Rzadkiewicz, J. ; Sujkowski, Z. ; Hoszowska, Joanna ; Slabkowska, K. ; Polasik, M.

In: Brazilian Journal of Physics, 2006, vol. 36, no. 2B, p. 546-549